Systems and methods for determining examination parameters

ABSTRACT

Systems and methods for determining one or more target examination parameters is provided. The methods may include obtaining target examination information of a subject and generating one or more initial examination parameters based on the target examination information. The methods may further include obtaining one or more historical examination parameters associated with the subject and updating at least one of the one or more initial examination parameters based on the one or more historical examination parameters to obtain one or more target examination parameters. The one or more target examination parameters may be used for performing a target examination on the subject.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. patent application Ser. No.17/105,643, filed on Nov. 27, 2020, which is a continuation ofInternational Patent Application No. PCT/CN2019/088886, filed on May 28,2019, which claims priority to Chinese Application No. 201810525559.4,filed on May 28, 2018, and Chinese Application No. 201811287450.8, filedon Oct. 31, 2018, and the entire contents of each of the above relatedapplications are hereby incorporated by reference.

TECHNICAL FIELD

The present disclosure generally relates to the field of medicaltechnology, and more particularly, relates to systems and methods fordetermining one or more target examination parameters for a targetexamination to be performed on a subject.

BACKGROUND

Before an examination is performed on a subject (e.g., a patient), thesubject usually needs to provide examination information such as thename, the age, the gender, a type of the examination, a target portionof the subject to be examined, etc. A user (e.g., an operator or adoctor) can determine one or more examination parameters for theexamination to be performed on the subject. In some cases, the one ormore parameters can be unsuitable for the examination to be performed onthe subject. The user may sometimes need to correct at least one of theone or more examination parameters and perform the examination on thesubject again. The examination may be, for example, a medicalexamination such as a scan on the subject using an imaging device. Toperform the scan on the target portion of the subject, the user oftenneeds to position the subject in the imaging device and determine atarget region (i.e., an examination parameter) that includes the targetportion of the subject to be scanned using a laser indicator or aradiation field indicator of a beam limiter. This may causeinconvenience to the subject and/or increase the workload of the user.Therefore, it is desired to provide systems and methods for moreaccurately and efficiently determine one or more examination parametersfor an examination on a subject.

SUMMARY

According to an aspect of the present disclosure, a method is provided.The method may be implemented on a computing device having at least oneprocessor and at least one non-transitory storage medium. The method mayinclude obtaining height data of a subject. The method may furtherinclude determining, based on the height data of the subject, a targetregion corresponding to a target portion of the subject for a scan onthe subject by an imaging device. The target portion may be within thetarget region. The method may further include determining, based on thetarget region, a plurality of movement parameters associated with theimaging device. The plurality of movement parameters may include atleast one start position and at least one end position associated withone or more components of the imaging device.

In some embodiments, the determining, based on the height data of thesubject, a target region corresponding to a target portion of thesubject to be scanned by an imaging device may include obtaining adatabase including a plurality of datasets, wherein each of theplurality of datasets may include height data and a plurality ofcandidate regions corresponding to a plurality of candidate portionsassociated with a plurality of candidate height data; determining one ormore target datasets from the plurality of datasets, wherein the heightdata in the one or more target datasets is closest, among the pluralityof datasets, to the height data of the subject; and determining thetarget region based on one or more candidate regions in the one or moretarget datasets that correspond to the target portion.

In some embodiments, the method may further include determining that theheight data of multiple target datasets, among the plurality ofdatasets, is closest to the height data of the subject. The determiningthe target region based on one or more candidate regions in the one ormore target datasets that correspond to the target portion may includeidentifying, in the multiple target datasets, multiple candidate regionscorresponding to the target portion; and determining, based on themultiple candidate regions corresponding to the target portion, anaverage region as the target region.

In some embodiments, the method may further include determining adifference between the height data in the one or more target datasetsand the height data of the subject; comparing the difference with athreshold; and in response to a determination that the difference isgreater than the threshold, correcting the target region.

In some embodiments, the method may further include storing the heightdata of the subject and the target region corresponding to the targetportion of the subject in the database.

In some embodiments, the method may further include comparing a size ofthe target region and a size of a maximum scanning range of a singlescan by the imaging device; and in response to a result that the size ofthe target region is greater than the size of the maximum scanning rangeof a single scan by the imaging device, causing the imaging device toperform, based on the plurality of movement parameters, a plurality ofsub-scans on the target portion to obtain a plurality of images, whereinthe plurality of movement parameters include a plurality of startpositions corresponding to the plurality of sub-scans and a plurality ofend positions corresponding to the plurality of sub-scans; andgenerating a panoramic image by stitching the plurality of images.

In some embodiments, the method further include causing one or morecomponents of the imaging device to move according to the plurality ofmovement parameters to obtain a simulated region to be scanned on thesubject and determining whether the simulated region matches the targetportion of the subject. The method may further include in response to adetermination that the simulated region does not match the targetportion of the subject, correcting at least one of the plurality ofmovement parameters.

In some embodiments, the method may further include identifying thesimulated region using at least one of a laser indicator or a radiationfield indicator of a beam limiter.

In some embodiments, the determining, based on the target region, aplurality of movement parameters associated with the imaging device mayinclude determining a position of the subject in the imaging device, anddetermining the plurality of movement parameters based on the targetregion and the position of the subject in the imaging device.

According to another aspect of the present disclosure, a system isprovided. The system may include at least one non-transitory storagemedium including a set of instructions and at least one processor incommunication with the at least one non-transitory storage medium. Whenexecuting the set of instructions, the at least one processor may bedirected to cause the system to obtain height data of a subject. The atleast one processor may be further directed to cause the system todetermine, based on the height data of the subject, a target regioncorresponding to a target portion of the subject for a scan on thesubject by an imaging device. The target portion may be within thetarget region. The at least one processor may be further directed tocause the system to determine, based on the target region, a pluralityof movement parameters associated with the imaging device. The pluralityof movement parameters may include at least one start position and atleast one end position associated with one or more components of theimaging device.

According to yet another aspect of the present disclosure, a system isprovided. The system may include an obtaining module, configured toobtain height data of a subject. The system may further include adetermination module, configured to determine, based on the height dataof the subject, a target region corresponding to a target portion of thesubject for a scan on the subject by an imaging device. The targetportion may be within the target region. The system may further includea scanning module, configured to determine, based on the target region,a plurality of movement parameters associated with the imaging device.The plurality of movement parameters may include at least one startposition and at least one end position associated with one or morecomponents of the imaging device.

According to still another aspect of the present disclosure, anon-transitory computer readable medium is provided. The non-transitorycomputer readable medium may include at least one set of instructions.When executed by at least one processor of a computing device, the atleast one set of instructions may direct the at least one processor toobtain a database including a plurality of datasets. Each of theplurality of datasets may include height data and a plurality ofcandidate regions corresponding to a plurality of candidate portionsassociated with a plurality of candidate height data. The at least oneset of instructions may further direct the at least one processor todetermine one or more target datasets from the plurality of datasets.The height data in the one or more target datasets may be closest, amongthe plurality of datasets, to the height data of the subject. The atleast one set of instructions may further direct the at least oneprocessor to determine the target region based on one or more candidateregions in the one or more target datasets that correspond to the targetportion.

According to yet another aspect of the present disclosure, a method fordetermining one or more target examination parameters is provided. Themethod may be implemented on a computing device having at least oneprocessor and at least one non-transitory storage medium. The method mayinclude obtaining target examination information of a subject andgenerating one or more initial examination parameters based on thetarget examination information. The method may further include obtainingone or more historical examination parameters associated with thesubject and updating at least one of the one or more initial examinationparameters based on the one or more historical examination parameters toobtain one or more target examination parameters. The one or more targetexamination parameters may be used for performing a target examinationon the subject.

In some embodiments, the obtaining one or more historical examinationparameters of the subject may include obtaining one or more firsthistorical examination records associated with the subject; determiningwhether the one or more first historical examination records include oneor more second historical examination records matching the targetexamination information; and in response to a determination that the oneor more first historical examination records include one or more secondhistorical examination records matching the target examinationinformation, obtaining the one or more historical examination parametersfrom the one or more second historical examination records.

In some embodiments, the obtaining the one or more historicalexamination parameters from the one or more second historicalexamination records may include determining whether only one secondhistorical examination record matches the target examinationinformation; and in response to a determination that only one secondhistorical examination record matches the target examinationinformation, obtaining the one or more historical examination parametersfrom the only one second historical examination record.

In some embodiments, the obtaining the one or more historicalexamination parameters from the one or more second historicalexamination records may include assessing, for each of the one or moresecond historical examination records, a degree of similarity betweenexamination information of an examination corresponding to the secondhistorical examination record and the target examination information;identifying, from the one or more second historical examination records,a third historical examination record of an examination that has, amongthe one or more second historical examination records, a highest degreeof similarity with the target examination information; and obtaining theone or more historical examination parameters from the third historicalexamination record.

In some embodiments, the assessing, for each of the one or more secondhistorical examination records, a degree of similarity betweenexamination information of an examination corresponding to the secondhistorical examination record and the target examination information mayinclude comparing, for each of the one or more second historicalexamination records, a time when an examination corresponding to thesecond historical examination record occurred and a time of the targetexamination. The identifying a third historical examination record of anexamination that has, among the one or more second historicalexamination records, a highest degree of similarity with the targetexamination information may include designating a second historicalexamination record of an examination that, among the one or more secondhistorical examination records, occurred at a time closest to the timeof the target examination as the third historical examination record.

In some embodiments, the assessing, for each of the one or more secondhistorical examination records, a degree of similarity betweenexamination information of an examination corresponding to the secondhistorical examination record and the target examination information mayinclude comparing, for each of the one or more second historicalexamination records, a parameter of interest of a device used in anexamination corresponding to the second historical examination recordand a corresponding parameter of a device to be used in the targetexamination.

In some embodiments, the comparing, for each of the one or more secondhistorical examination records, a parameter of interest of a device usedin an examination corresponding to the second historical examinationrecord and a corresponding parameter of a device to be used in thetarget examination may include determining that for each examinationthat corresponds to one of the one or more second historical examinationrecords, the parameter of interest of a device used therein is differentfrom the corresponding parameter of the device to be used in the targetexamination; and in response to a determination that for eachexamination that corresponds to one of the one or more second historicalexamination records, the parameter of interest of a device used thereinis different from the corresponding parameter of the device to be usedin the target examination, comparing a time when each of one or moreexaminations corresponding to the one or more second historicalexamination records occurred and a time of the target examination. Theidentifying a third historical examination record of an examination thathas, among the one or more second historical examination records, ahighest degree of similarity with the target examination information mayinclude designating a second historical examination record of anexamination that, among the one or more second historical examinationrecords, occurred at a time closest to the time of the targetexamination as the third historical examination record.

In some embodiments, the comparing a parameter of interest of a deviceused in an examination corresponding to each of the one or more secondhistorical examination records and a corresponding parameter of a deviceto be used in the target examination may include determining that theparameter of interest of a device used in only one examinationcorresponding to one of the one or more second historical examinationrecords is the same as the corresponding parameter of the device to beused in the target examination. The identifying a third historicalexamination record of an examination that has, among the one or moresecond historical examination records, a highest degree of similaritywith the target examination information may include designating a secondhistorical examination record corresponding to the only examinationusing the device whose parameter of interest is the same as thecorresponding parameter of the device to be used in the targetexamination as the third historical examination record.

In some embodiments, the comparing a parameter of interest of a deviceused in an examination corresponding to each of the one or more secondhistorical examination records and a corresponding parameter of a deviceto be used in the target examination may include determining that foreach of more than one examination that corresponds to more than onesecond historical examination record of the one or more secondhistorical examination records, the parameter of interest of a deviceused therein is the same as the corresponding parameter of the device tobe used in the target examination; and in response to a determinationthat for each of more than one examination that corresponds to more thanone second historical examination of the one or more second historicalexamination records, the parameter of interest of a device used thereinis the same as the corresponding parameter of the device to be used inthe target examination, comparing a time when each of the more than oneexamination occurred and a time of the target examination. Theidentifying a third historical examination record of an examination thathas, among the one or more second historical examination records, ahighest degree of similarity with the target examination information mayinclude designating a second historical examination record of anexamination that, among the more than one second historical examinationrecord corresponding to the more than one examination each using adevice whose parameter of interest is the same as the correspondingparameter of the device to be used in the target examination, occurredat a time closest to the time of the target examination as the thirdhistorical examination record.

In some embodiments, the comparing, for each of the one or more secondhistorical examination records, a parameter of interest of a device usedin an examination corresponding to the second historical examinationrecord and a corresponding parameter of a device to be used in thetarget examination may include determining that, for each of more thanone examination that corresponds to more than one second historicalexamination record of the one or more second historical examinationrecords, the parameter of interest of a device used therein is the sameas the corresponding parameter of the device to be used in the targetexamination; and in response to a determination that for each of morethan one examination that corresponds to more than one second historicalexamination record of the one or more second historical examinationrecords, the parameter of interest of a device used therein is the sameas the corresponding parameter of the device to be used in the targetexamination, comparing, for each of the more than one examination, atleast one position parameter associated with the examination and atleast one position parameter associated with the subject to be used inthe target examination. The identifying a third historical examinationrecord of an examination that has, among the one or more secondhistorical examination records, a highest degree of similarity with thetarget examination information may include determining whether for onlyone examination among the more than one examination each using thedevice whose parameter of interest is the same as the correspondingparameter of the device to be used in the target examination, at leastone position parameter associated with the subject used therein is thesame as the at least one position parameter associated with the subjectto be used in the target examination; and in response to a determinationthat for only one examination among the more than one examination eachusing the device whose parameter of interest is the same as thecorresponding parameter of the device to be used in the targetexamination, at least one position parameter associated with the subjectused therein is the same as the at least one position parameterassociated with the subject to be used in the target examination,designating a second historical examination record corresponding to theonly one examination as the third historical examination record.

In some embodiments, the comparing, for each of the one or more secondhistorical examination records, a parameter of interest of a device usedin an examination corresponding to the second historical examinationrecord and a corresponding parameter of a device to be used in thetarget examination may include determining that for each of more thanone examination that corresponds to more than one second historicalexamination of the one or more second historical examination records,the parameter of interest of a device used therein is the same as thecorresponding parameter of the device to be used in the targetexamination; and in response to a determination that for each of morethan one examination that corresponds to more than one second historicalexamination of the one or more second historical examination records,the parameter of interest of a device used therein is the same as thecorresponding parameter of the device to be used in the targetexamination, comparing at least one position parameter associated withthe subject in the more than one examination and at least one positionparameter associated with the subject in the target examination. Theidentifying a third historical examination record of an examination thathas, among the one or more second historical examination records, ahighest degree of similarity with the target examination information mayinclude determining whether for each of multiple examinations among themore than one examination each using a device whose parameter ofinterest is the same as the corresponding parameter of the device to beused in the target examination, at least one position parameterassociated with the subject used therein is the same as the at least oneposition parameter associated with the subject to be used in the targetexamination; and in response to a determination that for each ofmultiple examinations among the more than one examination each using adevice whose parameter of interest is the same as the correspondingparameter of the device to be used in the target examination, at leastone position parameter associated with the subject used therein is thesame as the at least one position parameter associated with the subjectto be used in the target examination, comparing a time when each of themultiple examinations occurred and a time of the target examination, anddesignating a second historical examination record of an examinationthat, among the multiple examinations each using a device whoseparameter of interest is the same as the corresponding parameter of thedevice to be used in the target examination and having at least oneposition parameter associated with the subject that is the same as theat least one position parameter associated with the subject to be usedin the target examination, occurred at a time closest to the time of thetarget examination as the third historical examination record.

In some embodiments, the comparing, for each of the one or more secondhistorical examination records, a parameter of interest of a device usedin an examination corresponding to the second historical examinationrecord and a corresponding parameter of a device to be used in thetarget examination may include determining that for each of more thanone examination that corresponds to more than one of the one or moresecond historical examination records, the parameter of interest of adevice used therein is the same as the corresponding parameter of thedevice to be used in the target examination; and in response to adetermination that for each of more than one examination thatcorresponds to more than one of the one or more second historicalexamination records, the parameter of interest of a device used thereinis the same as the corresponding parameter of the device to be used inthe target examination, comparing at least one position parameterassociated with the subject in the more than one examination and atleast one position parameter associated with the subject in the targetexamination. The identifying a third historical examination record of anexamination that has, among the one or more second historicalexamination records, a highest degree of similarity with the targetexamination information may include determining whether for eachexamination of the more than one examination each using a device whoseparameter of interest is the same as the corresponding parameter of thedevice to be used in the target examination, at least one positionparameter associated with the subject used therein is different from theat least one position parameter associated with the subject to be usedin the target examination; and in response to a determination that foreach examination of the more than one examination each using a devicewhose parameter of interest is the same as the corresponding parameterof the device to be used in the target examination, at least oneposition parameter associated with the subject used therein is differentfrom the at least one position parameter associated with the subject tobe used in the target examination, comparing a time when each of themultiple examinations occurred and a time of the target examination, anddesignating a second historical examination record of an examinationthat, among the more than one second historical examination recordcorresponding to the more than one examination each using a device whoseparameter of interest is the same as the corresponding parameter of thedevice to be used in the target examination, occurred at a time closestto the time of the target examination as the third historicalexamination record.

In some embodiments, the parameter of interest of the device may includea device model.

In some embodiments, the method may further include storing the one ormore examination parameters of the target examination of the subject.

In some embodiments, the computing device may include a data recorder.

In some embodiments, the target examination may be a scan on the subjectby an imaging device. The target examination information of the subjectmay include height data and a target portion of the subject to bescanned by the imaging device. The one or more target examinationparameters may include a target region corresponding to the targetportion of the subject. The target portion may be within the targetregion.

In some embodiments, the method may further include determining, basedon the target region, a plurality of movement parameters associated withthe imaging device, wherein the plurality of movement parameters includeat least one start position and at least one end position associatedwith one or more components of the imaging device.

In some embodiments, the determining, based on the target region, aplurality of movement parameters associated with the imaging device mayinclude determining a position of the subject in the imaging device; anddetermining the plurality of movement parameters based on the targetregion and the position of the subject in the imaging device.

According to still another aspect of the present disclosure, a systemfor determining one or more target examination parameters is provided.The system may include at least one non-transitory storage mediumincluding a set of instructions and at least one processor incommunication with the at least one non-transitory storage medium. Whenexecuting the set of instructions, the at least one processor may bedirected to cause the system to obtain target examination information ofa subject and generate one or more initial examination parameters basedon the target examination information. The at least one processor may befurther directed to cause the system to obtain one or more historicalexamination parameters associated with the subject and update at leastone of the one or more initial examination parameters based on the oneor more historical examination parameters to obtain one or more targetexamination parameters, wherein the one or more target examinationparameters are used for performing a target examination on the subject.

According to yet another aspect of the present disclosure, a system fordetermining one or more target examination parameters is provided. Thesystem may include an acquisition module, configured to obtain targetexamination information of a subject and obtain one or more historicalexamination parameters associated with the subject. The system mayfurther include a parameter generation module, configured to generateone or more initial examination parameters based on the targetexamination information. The system may further include a parameterupdating module, configured to update at least one of the one or moreinitial examination parameters based on the one or more historicalexamination parameters to obtain one or more target examinationparameters. The one or more target examination parameters may be usedfor performing a target examination on the subject.

According to still another aspect of the present disclosure, anon-transitory computer readable medium is provided. The non-transitorycomputer readable medium may include at least one set of instructionsfor determining one or more target examination parameters. When executedby at least one processor of a computing device, the at least one set ofinstructions may direct the at least one processor to obtain targetexamination information of a subject; generate one or more initialexamination parameters based on the target examination information;obtain one or more historical examination parameters associated with thesubject; and update at least one of the one or more initial examinationparameters based on the one or more historical examination parameters toobtain one or more target examination parameters, wherein the one ormore target examination parameters are used for performing a targetexamination on the subject.

Additional features will be set forth in part in the description whichfollows, and in part will become apparent to those skilled in the artupon examination of the following and the accompanying drawings or maybe learned by production or operation of the examples. The features ofthe present disclosure may be realized and attained by practice or useof various aspects of the methodologies, instrumentalities andcombinations set forth in the detailed examples discussed below.

BRIEF DESCRIPTION OF THE DRAWINGS

The present disclosure is further described in terms of exemplaryembodiments. These exemplary embodiments are described in detail withreference to the drawings. The drawings are not to scale. Theseembodiments are non-limiting exemplary embodiments, in which likereference numerals represent similar structures throughout the severalviews of the drawings, and wherein:

FIG. 1 is a schematic diagram illustrating an exemplary system forperforming a target examination on a subject according to someembodiments of the present disclosure;

FIG. 2 is a schematic diagram illustrating exemplary hardware and/orsoftware components of an exemplary computing device according to someembodiments of the present disclosure;

FIG. 3 is a schematic diagram illustrating exemplary hardware and/orsoftware components of an exemplary mobile device according to someembodiments of the present disclosure;

FIG. 4 is a block diagram illustrating an exemplary system forperforming a scan on a subject according to some embodiments of thepresent disclosure;

FIG. 5 is a block diagram illustrating an exemplary system forperforming a target examination on a subject according to someembodiments of the present disclosure;

FIG. 6 is a flowchart illustrating an exemplary process for determininga plurality of movement parameters associated with an imaging deviceaccording to some embodiments of the present disclosure;

FIG. 7 is a schematic diagram illustrating an exemplary X-ray machineaccording to some embodiments of the present disclosure;

FIG. 8 is a flowchart illustrating an exemplary process for determiningthe target region associated with an imaging device according to someembodiments of the present disclosure;

FIG. 9 is a flowchart illustrating an exemplary process for performing ascan on the subject based on the plurality of movement parametersassociated with the imaging device according to some embodiments of thepresent disclosure;

FIG. 10 is a flowchart illustrating an exemplary process for determiningone or more target examinations for a target examination on a subjectaccording to some embodiments of the present disclosure; and

FIG. 11 is a flowchart illustrating an exemplary process for determiningthe one or more target examination parameters for the target examinationon the subject based on multiple second historical examination recordsthat match target examination of the subject according to someembodiments of the present disclosure.

DETAILED DESCRIPTION

In the following detailed description, numerous specific details are setforth by way of examples in order to provide a thorough understanding ofthe relevant disclosure. However, it should be apparent to those skilledin the art that the present disclosure may be practiced without suchdetails. In other instances, well-known methods, procedures, systems,components, and/or circuitry have been described at a relativelyhigh-level, without detail, in order to avoid unnecessarily obscuringaspects of the present disclosure. Various modifications to thedisclosed embodiments will be readily apparent to those skilled in theart, and the general principles defined herein may be applied to otherembodiments and applications without departing from the spirit and scopeof the present disclosure. Thus, the present disclosure is not limitedto the embodiments shown, but to be accorded the widest scope consistentwith the claims.

The terminology used herein is for the purpose of describing particularexample embodiments only and is not intended to be limiting. As usedherein, the singular forms “a,” “an,” and “the” may be intended toinclude the plural forms as well, unless the context clearly indicatesotherwise. It will be further understood that the terms “comprise,”“comprises,” and/or “comprising,” “include,” “includes,” and/or“including,” when used in this specification, specify the presence ofstated features, integers, steps, operations, elements, and/orcomponents, but do not preclude the presence or addition of one or moreother features, integers, steps, operations, elements, components,and/or groups thereof.

It will be understood that the term “system,” “engine,” “unit,”“module,” and/or “block” used herein are one method to distinguishdifferent components, elements, parts, section or assembly of differentlevel in ascending order. However, the terms may be displaced by anotherexpression if they achieve the same purpose.

Generally, the word “module,” “unit,” or “block,” as used herein, refersto logic embodied in hardware or firmware, or to a collection ofsoftware instructions. A module, a unit, or a block described herein maybe implemented as software and/or hardware and may be stored in any typeof non-transitory computer-readable medium or another storage device. Insome embodiments, a software module/unit/block may be compiled andlinked into an executable program. It will be appreciated that softwaremodules can be callable from other modules/units/blocks or fromthemselves, and/or may be invoked in response to detected events orinterrupts. Software modules/units/blocks configured for execution oncomputing devices (e.g., processor 210 as illustrated in FIG. 2 ) may beprovided on a computer-readable medium, such as a compact disc, adigital video disc, a flash drive, a magnetic disc, or any othertangible medium, or as a digital download (and can be originally storedin a compressed or installable format that needs installation,decompression, or decryption prior to execution). Such software code maybe stored, partially or fully, on a storage device of the executingcomputing device, for execution by the computing device. Softwareinstructions may be embedded in firmware, such as an EPROM. It will befurther appreciated that hardware modules/units/blocks may be includedin connected logic components, such as gates and flip-flops, and/or canbe included of programmable units, such as programmable gate arrays orprocessors. The modules/units/blocks or computing device functionalitydescribed herein may be implemented as software modules/units/blocks,but may be represented in hardware or firmware. In general, themodules/units/blocks described herein refer to logicalmodules/units/blocks that may be combined with othermodules/units/blocks or divided into sub-modules/sub-units/sub-blocksdespite their physical organization or storage. The description may beapplicable to a system, an engine, or a portion thereof.

It will be understood that when a unit, engine, module or block isreferred to as being “on,” “connected to,” or “coupled to,” anotherunit, engine, module, or block, it may be directly on, connected orcoupled to, or communicate with the other unit, engine, module, orblock, or an intervening unit, engine, module, or block may be present,unless the context clearly indicates otherwise. As used herein, the term“and/or” includes any and all combinations of one or more of theassociated listed items.

These and other features, and characteristics of the present disclosure,as well as the methods of operation and functions of the relatedelements of structure and the combination of parts and economies ofmanufacture, may become more apparent upon consideration of thefollowing description with reference to the accompanying drawings, allof which form a part of this disclosure. It is to be expresslyunderstood, however, that the drawings are for the purpose ofillustration and description only and are not intended to limit thescope of the present disclosure. It is understood that the drawings arenot to scale.

Provided herein are systems and components for an imaging system. Insome embodiments, the imaging system may include a single modalityimaging system and/or a multi-modality imaging system. The singlemodality imaging system may include, for example, an X-ray imagingsystem, a computed tomography (CT) system, a magnetic resonance imaging(MRI) system, an ultrasonography system, a positron emission tomography(PET) system, or the like, or any combination thereof. Themulti-modality imaging system may include, for example, an X-rayimaging-magnetic resonance imaging (X-ray-MRI) system, a positronemission tomography-X-ray imaging (PET-X-ray) system, a single photonemission computed tomography-magnetic resonance imaging (SPECT-MRI)system, a positron emission tomography-computed tomography (PET-CT)system, a digital subtraction angiography-magnetic resonance imaging(DSA-MRI) system, etc. It should be noted that the imaging systemdescribed below is merely provided for illustration purposes, and notintended to limit the scope of the present disclosure.

According to an aspect of the present disclosure, mechanisms (which caninclude methods, systems, a computer-readable medium, etc.) fordetermining a plurality of movement parameters associated with animaging device for a scan on a subject is provided. For example, heightdata of the subject may be obtained. A target region corresponding to atarget portion of the subject for the scan may be determined based onthe height data. A plurality of datasets may be obtained. Each of theplurality of datasets may include height data and a plurality ofcandidate regions corresponding to a plurality of candidate portionsassociated with the candidate height data. One or more target datasetsmay be determined from a plurality of datasets stored in a database. Theheight data in the one or more target datasets may be closest, among theplurality of datasets, to the height data of the subject. The targetregion may be determined based on one or more candidate regions in theone or more target datasets. The plurality of movement parameters may bedetermined based on the target region. The plurality of movementparameters may include at least one start location and at least one endlocation associated with one or more components of the imaging device,such as a couch or a gantry. The method for determining the plurality ofmovement parameters as described in the present disclosure is relativelysimple and fast. Since the target region may be determinedautomatically, the operation process of a user such as a doctor or anoperator may be simplified, and the time needed for the scan may bereduced.

According to another aspect of the present disclosure, mechanisms (whichcan include methods, systems, a computer-readable medium, etc.) fordetermining one or more target examination parameters for a targetexamination to be performed on a subject are provided. The method mayinclude obtaining target examination information of the subject. Thetarget examination information may include, for example, the name, theage, the gender, a type of the target examination, a target portion ofthe subject to be examined, etc. A plurality of initial examinationparameters may be determined for the target examination. The one or moretarget examination parameters may be obtained by updating the pluralityof initial examination parameters by updating at least one of the one ormore initial examination parameters based on one or more historicalexamination parameters. The one or more historical examinationparameters may be obtained from one of the historical examinationrecords of the subject that matches the target examination information.The method for determining the one or more target examination parametersas described in the present disclosure may improve an accuracy of theone or more target examination parameters for the subject. Since the oneor more target parameters are determined based on a historicalexamination record of the subject, the one or more target examinationparameters may be more suitable for the subject. In some cases, thetarget examination may be a scan on the target portion of the subjectusing an imaging device. The target examination information of thesubject may include height data of the subject and a target portion(e.g., a lung, a leg) of the subject. The one or more target examinationparameters may include a target region of the subject to be scanned bythe imaging device. The target portion may be within the target region.Since the target region can be automatically determined based on ahistorical examination record of the subject, the target region may bemore accurate. The workload of the operator or the doctor may also bedecreased.

FIG. 1 is a schematic diagram illustrating an exemplary system forperforming a target examination on a subject according to someembodiments of the present disclosure. As shown, the system 100 mayinclude a device 110 for performing a target examination on the subject,a network 120, one or more terminals 130, a processing device 140, and astorage device 150. In some embodiments, the device 110, the terminal(s)130, the processing device 140, and/or the storage device 150 may beconnected to and/or communicate with each other via a wirelessconnection (e.g., the network 120), a wired connection, or a combinationthereof. The connection between the components of the system 100 may bevariable. Merely by way of example, the device 110 may be connected tothe processing device 140 through the network 120, as illustrated inFIG. 1 . As another example, the device 110 may be connected to theprocessing device 140 directly. As a further example, the storage device150 may be connected to the processing device 140 through the network120, as illustrated in FIG. 1 , or connected to the processing device140 directly. As still a further example, a terminal 130 may beconnected to the processing device 140 through the network 120, asillustrated in FIG. 1 , or connected to the processing device 140directly.

The device 110 may perform a target examination on a subject (e.g., apatient). For example, the target examination may be a medicalexamination. The device 110 may be an imaging device for performing ascan on a target portion (e.g., a lung, a liver) of the subject. Asanother example, the device may be an electrocardiograph for determiningelectrocardio signals of the heart of the subject. In some embodiments,the imaging device 110 may include a single-modality scanner and/or amulti-modality scanner. The single-modality scanner may include, forexample, a computed tomography (CT) scanner, a magnetic resonance (MR)scanner, an ultrasonoscope, a positron emission tomography (PET)scanner, etc. The multi-modality scanner may include a single photonemission computed tomography-computed tomography (SPECT-CT) scanner, apositron emission tomography-computed tomography (PET-CT) scanner, acomputed tomography-ultra-sonic (CT-US) scanner, a digital subtractionangiography-computed tomography (DSA-CT) scanner, or the like, or acombination thereof. In some embodiments, the subject may include abody, a substance, an object, or the like, or a combination thereof. Insome embodiments, the target portion of the subject to be scanned mayinclude the head, the thorax, the abdomen, or the like, or a combinationthereof.

In some embodiments, the device 110 may include a gantry 111, a detector112, a detecting region 113, a scanning table 114, and a radiationsource 115. The gantry 111 may support the detector 112 and theradiation source 115. A subject may be placed on the scanning table 114to be scanned. The radiation source 115 may emit radiation beams to thesubject. The radiation may include a particle ray, a photon ray, or thelike, or a combination thereof. In some embodiments, the radiation beamsmay include a plurality of radiation particles (e.g., neutrons, protons,electron, p-mesons, heavy ions), a plurality of radiation photons (e.g.,X-ray, a y-ray, ultraviolet, laser), or the like, or a combinationthereof. The detector 112 may detect radiation beams and/or radiationevents (e.g., gamma photons) emitted from the detecting region 113. Insome embodiments, the detector 112 may include a plurality of detectorunits. The detector units may include a scintillation detector (e.g., acesium iodide detector) or a gas detector. The detector unit may be asingle-row detector or a multi-rows detector.

In some embodiments, the device 110 may be integrated with one or moreother devices that may facilitate the scanning of the subject, such as,an image-recording device. The image-recording device may be configuredto take various types of images related to the subject. For example, theimage-recording device may be a two-dimensional (2D) camera that takespictures of the exterior or outline of the subject. As another example,the image-recording device may be a 3D scanner (e.g., a laser scanner,an infrared scanner) that records the spatial representation of thesubject. It should be noted that the structure of the device 110 shownin FIG. 1 is only for illustration purposes. For example, the device 110may be an X-ray machine as shown in FIG. 7 .

The network 120 may include any suitable network that can facilitateexchange of information and/or data for the system 100. In someembodiments, one or more components of the system 100 (e.g., the device110, the processing device 140, the storage device 150, the terminal(s)130) may communicate information and/or data with one or more othercomponents of the system 100 via the network 120. For example, theprocessing device 140 may obtain image data from the device 110 via thenetwork 120. As another example, the processing device 140 may obtainuser instruction(s) from the terminal(s) 130 via the network 120. Thenetwork 120 may be or include a public network (e.g., the Internet), aprivate network (e.g., a local area network (LAN)), a wired network, awireless network (e.g., an 802.11 network, a Wi-Fi network), a framerelay network, a virtual private network (VPN), a satellite network, atelephone network, routers, hubs, switches, server computers, and/or anycombination thereof. For example, the network 120 may include a cablenetwork, a wireline network, a fiber-optic network, a telecommunicationsnetwork, an intranet, a wireless local area network (WLAN), ametropolitan area network (MAN), a public telephone switched network(PSTN), a Bluetooth™ network, a ZigBee™ network, a near fieldcommunication (NFC) network, or the like, or any combination thereof. Insome embodiments, the network 120 may include one or more network accesspoints. For example, the network 120 may include wired and/or wirelessnetwork access points such as base stations and/or internet exchangepoints through which one or more components of the system 100 may beconnected to the network 120 to exchange data and/or information.

The terminal(s) 130 may be connected to and/or communicate with thedevice 110, the processing device 140, and/or the storage device 150.For example, the terminal(s) 130 may obtain one or more targetexamination parameters of the target examination to be performed on thesubject from the processing device 140. In some embodiments, theterminal(s) 130 may be part of the processing device 140. In someembodiments, the terminal(s) 130 may include a mobile device 131, atablet computer 132, a laptop computer 133, or the like, or anycombination thereof. For example, the mobile device 131 may include amobile phone, a personal digital assistant (PDA), a gaming device, anavigation device, a point of sale (POS) device, a laptop, a tabletcomputer, a desktop, or the like, or any combination thereof.

In some embodiments, the terminal(s) 130 may include an input device, anoutput device, etc. The input device may include alphanumeric and otherkeys that may be input via a keyboard, a touch screen (for example, withhaptics or tactile feedback), a speech input, an eye tracking input, abrain monitoring system, or any other comparable input mechanism. Theinput information received through the input device may be transmittedto the processing device 140 via, for example, a bus, for furtherprocessing. Other types of the input device may include a cursor controldevice, such as a mouse, a trackball, or cursor direction keys, etc. Theoutput device may include a display, a speaker, a printer, or the like,or a combination thereof. In some embodiments, interactions between theuser and the system 100 may be implemented via the terminal(s) 130. Forexample, the user may give an instruction to one or more components ofthe system 100 via a user interface on the terminal(s) 130. Theinstruction may include directing the processing device 140 to startdetermining one or more target examination parameters for the targetexamination, directing the device 110 to start to perform the targetexamination on the subject according to the one or more targetexamination parameters for the target examination, etc. As anotherexample, the terminal(s) 130 may present information to the user via theuser interface, such as the one or more target examination parametersdetermined by the processing device 140, examination data obtained bythe device 110, etc.

The processing device 140 may process data and/or information obtainedfrom the device 110, the storage device 150, the terminal(s) 130, orother components of the system 100. For example, the processing device140 may obtain examination information of the one or more historicalexamination records of the subject. The processing device 140 maydetermine one or more initial examination parameters for the targetexamination on the subject. The processing device 140 may update atleast one of the one or more initial examination parameters to obtainone or more target examination parameters for the target examination onthe subject. As another example, the processing device 140 may obtainheight data of the subject. The processing device 140 may determine,based on the height data, a target region corresponding to a targetportion of the subject for a scan on the subject by the device 110(e.g., an imaging device). The processing device 140 may furtherdetermine a plurality of movement parameters associated with the imagingdevice.

In some embodiments, the processing device 140 may be a single server ora server group. The server group may be centralized or distributed. Insome embodiments, the processing device 140 may be local to or remotefrom the system 100. For example, the processing device 140 may accessinformation and/or data from the device 110, the storage device 150,and/or the terminal(s) 130 via the network 120. As another example, theprocessing device 140 may be directly connected to the device 110, theterminal(s) 130, and/or the storage device 150 to access informationand/or data. In some embodiments, the processing device 140 may beimplemented on a cloud platform. For example, the cloud platform mayinclude a private cloud, a public cloud, a hybrid cloud, a communitycloud, a distributed cloud, an inter-cloud, a multi-cloud, or the like,or a combination thereof. In some embodiments, the processing device 140may be implemented by a computing device 200 having one or morecomponents as described in connection with FIG. 2 .

The storage device 150 may store data, instructions, and/or any otherinformation. In some embodiments, the storage device 150 may store dataobtained from the processing device 140, the terminal(s) 130, and/or thedevice 110. For example, the storage device 150 may store the targetexamination information of the subject and the one or more targetexamination parameters corresponding to the target examinationinformation. As another example, the storage device 150 may store theheight data of the subject and the target region corresponding to thetarget portion of the subject. In some embodiments, the storage device150 may store data and/or instructions that the processing device 140may execute or use to perform exemplary methods described in the presentdisclosure. In some embodiments, the storage device 150 may include amass storage device, a removable storage device, a volatileread-and-write memory, a read-only memory (ROM), or the like, or anycombination thereof. Exemplary mass storage may include a magnetic disk,an optical disk, a solid-state drive, etc. Exemplary removable storagemay include a flash drive, a floppy disk, an optical disk, a memorycard, a zip disk, a magnetic tape, etc. Exemplary volatileread-and-write memory may include a random access memory (RAM).Exemplary RAM may include a dynamic RAM (DRAM), a double date ratesynchronous dynamic RAM (DDR SDRAM), a static RAM (SRAM), a thyristorRAM (T-RAM), and a zero-capacitor RAM (Z-RAM), etc. Exemplary ROM mayinclude a mask ROM (MROM), a programmable ROM (PROM), an erasableprogrammable ROM (EPROM), an electrically erasable programmable ROM(EEPROM), a compact disk ROM (CD-ROM), and a digital versatile disk ROM,etc. In some embodiments, the storage device 150 may be implemented on acloud platform as described elsewhere in the disclosure.

In some embodiments, the storage device 150 may be connected to thenetwork 120 to communicate with one or more other components of thesystem 100 (e.g., the processing device 140, the terminal(s) 130). Oneor more components of the system 100 may access the data or instructionsstored in the storage device 150 via the network 120. In someembodiments, the storage device 150 may be part of the processing device140.

The above description for FIG. 1 is intended to be illustrative and notto limit the scope of the present disclosure. Many alternatives,modifications, and variations will be apparent to those skilled in theart. The features, structures, methods, and other characteristics of theexemplary embodiments described herein may be combined in various waysto obtain additional and/or alternative exemplary embodiments. Forexample, the storage device 150 may be a data storage including cloudcomputing platforms, such as public cloud, private cloud, community, andhybrid clouds, etc. However, those variations and modifications do notdepart the scope of the present disclosure.

FIG. 2 is a schematic diagram illustrating exemplary hardware and/orsoftware components of an exemplary computing device according to someembodiments of the present disclosure. In some embodiments, theprocessing device 140 may be implemented on the computing device 200shown in FIG. 2 . For example, the computing device 200 may be a datarecorder. The computing device 200 may include a processor 210, anon-volatile storage medium 230, a network interface 270, a display 280,and an input device 290 connected through a bus 220. The processor 210of the computing device 200 may be have computing and controllingcapabilities. The computing device 200 may include a non-volatilestorage medium 230 and a memory 260. The non-volatile storage medium 230may store an operation system 240 and computer programs 250. The memory260 may be used for the operation of the operation system 240 and thecomputer programs 250 stored in the non-volatile storage medium 230. Thecomputing device 200 may communicate with an external device (e.g.,through the network interface 270. The computer program may be executedby the processor 210 to implement a method for determining one or moretarget examination parameters for a target examination on the subject.The display 280 of the computing device 200 may be a liquid crystaldisplay or an electronic ink display. The input device of the computingdevice 200 may be a touch layer disposed on the display 280, a button, atrajectory ball, or a touchpad provided on an external housing of thecomputing device 200. As another example, the input device may be anexternal keyboard, a touchpad or a mouse.

The processor 210 may execute computer instructions (e.g., program code)and perform functions of the processing device 140 in accordance withtechniques described herein. The computer instructions may include, forexample, routines, programs, objects, components, data structures,procedures, modules, and functions, which perform particular functionsdescribed herein. For example, the processor 210 may process image dataobtained from the device 110, the terminals 130, the storage device 150,and/or any other component of the system 100. In some embodiments, theprocessor 210 may include one or more hardware processors, such as amicrocontroller, a microprocessor, a reduced instruction set computer(RISC), an application specific integrated circuits (ASICs), anapplication-specific instruction-set processor (ASIP), a centralprocessing unit (CPU), a graphics processing unit (GPU), a physicsprocessing unit (PPU), a microcontroller unit, a digital signalprocessor (DSP), a field programmable gate array (FPGA), an advancedRISC machine (ARM), a programmable logic device (PLD), any circuit orprocessor capable of executing one or more functions, or the like, orany combinations thereof.

Merely for illustration, only one processor is described in thecomputing device 200. However, it should be noted that the computingdevice 200 in the present disclosure may also include multipleprocessors, and thus operations and/or method operations that areperformed by one processor as described in the present disclosure mayalso be jointly or separately performed by the multiple processors. Forexample, if in the present disclosure the processor of the computingdevice 200 executes both operation A and operation B, it should beunderstood that operation A and operation B may also be performed by twoor more different processors jointly or separately in the computingdevice 200 (e.g., a first processor executes operation A and a secondprocessor executes operation B, or the first and second processorsjointly execute operation s A and B).

In some embodiments, the storage may include a mass storage device, aremovable storage device, a volatile read-and-write memory, a read-onlymemory (ROM), or the like, or any combination thereof. For example, themass storage may include a magnetic disk, an optical disk, a solid-statedrive, etc. The removable storage may include a flash drive, a floppydisk, an optical disk, a memory card, a zip disk, a magnetic tape, etc.The volatile read-and-write memory may include a random access memory(RAM). The RAM may include a dynamic RAM (DRAM), a double date ratesynchronous dynamic RAM (DDR SDRAM), a static RAM (SRAM), a thyristorRAM (T-RAM), and a zero-capacitor RAM (Z-RAM), etc. The ROM may includea mask ROM (MROM), a programmable ROM (PROM), an erasable programmableROM (EPROM), an electrically erasable programmable ROM (EEPROM), acompact disk ROM (CD-ROM), and a digital versatile disk ROM, etc. Insome embodiments, the storage may store one or more programs and/orinstructions to perform exemplary methods described in the presentdisclosure. For example, the storage may store a program for theprocessing device 140 for determining one or more target examinationparameters of a target examination to be performed on the subject.

The network interface 270 may be connected to a network (e.g., thenetwork 120) to facilitate data communications. For example, the networkinterface 270 may establish connections between the processing device140 and the device 110, the terminals 130, and/or the storage device150. The connection may be a wired connection, a wireless connection,any other communication connection that can enable data transmissionand/or reception, and/or any combination of these connections. The wiredconnection may include, for example, an electrical cable, an opticalcable, a telephone wire, or the like, or any combination thereof. Thewireless connection may include, for example, a Bluetooth™ link, aWi-Fi™ link, a WiMax™ link, a WLAN link, a ZigBee™ link, a mobilenetwork link (e.g., 3G, 4G, 5G), or the like, or a combination thereof.In some embodiments, the network interface 270 may be and/or include astandardized communication port, such as RS232, RS485, etc. In someembodiments, the network interface 270 may be a specially designedcommunication port. For example, the network interface 270 may bedesigned in accordance with the digital imaging and communications inmedicine (DICOM) protocol.

It will be understood by those skilled in the art that the structureshown in FIG. 2 is only provided for illustration purposes, which maynot limit the computing device 200 on which the present disclosure isimplemented. In some embodiments, the computing device 200 may includemore or fewer components than the components shown in FIG. 2 . In someembodiments, one or more components shown in FIG. 2 may be combined intoa single component.

FIG. 3 is a schematic diagram illustrating exemplary hardware and/orsoftware components of an exemplary mobile device according to someembodiments of the present disclosure. In some embodiments, the terminal130 may be implemented on the mobile device 300 shown in FIG. 3 . Asillustrated in FIG. 3 , the mobile device 300 may include acommunication platform 310, a display 320, a graphics processing unit(GPU) 330, a central processing unit (CPU) 340, an I/O 350, a memory360, and a storage 390. In some embodiments, any other suitablecomponent, including but not limited to a system bus or a controller(not shown), may also be included in the mobile device 300. In someembodiments, a mobile operating system 370 (e.g., iOS™, Android™,Windows Phone™) and one or more applications 380 may be loaded into thememory 360 from the storage 390 in order to be executed by the CPU 340.The applications 380 may include a browser or any other suitable mobileapps for receiving and rendering information relating to thedetermination of one or more target examination parameters or otherinformation from the processing device 140. User interactions with theinformation stream may be achieved via the I/O 350 and provided to theprocessing device 140 and/or other components of the system 100 via thenetwork 120.

To implement various modules, units, and their functionalities describedin the present disclosure, computer hardware platforms may be used asthe hardware platform(s) for one or more of the elements describedherein. A computer with user interface elements may be used to implementa personal computer (PC) or any other type of work station or terminaldevice. A computer may also act as a server if appropriately programmed.

FIG. 4 is a block diagram illustrating an exemplary system forperforming a scan on a subject according to some embodiments of thepresent disclosure. As illustrated in FIG. 4 , the system 400 mayinclude an obtaining module 410, a determination module 420, and ascanning module 430. In some embodiments, at least a part of the system400 may be implemented on the processing device 140. The modules may behardware circuits of all or part of the processing device 140. Themodules may also be implemented as an application or a set ofinstructions read and executed by the processing device 140. Further,the modules may be any combination of the hardware circuits and theapplication/instructions. For example, the modules may be the part ofthe processing device 140 when the processing device 140 is executingthe application/set of instructions.

The obtaining module 410 may obtain data from one or more components ofthe system 100, such as the storage device 150. In some embodiments, theobtaining module may obtain height data of a subject. The subject mayinclude a biological subject (e.g., an animal, a human) or anon-biological subject (e.g., a phantom). In some embodiments, theheight data of the subject may be obtained from a historical medicalrecord of the subject stored in the storage device 150. Alternatively,when there is no historical medical record that includes the height dataof the subject in the storage device 150, or when the subject is a childor a teenager whose height may increase as the subject grows older, ameasurement of the height of the subject may be performed before thescan to obtain the height data of the subject. In some embodiments, theobtaining module 410 may obtain a database including a plurality ofdatasets corresponding to different height data. Each of the pluralityof datasets may include height data and a plurality of candidate regionscorresponding to a plurality of candidate portions associated with theheight data. In some embodiments, the plurality of datasets may bedetermined based on a plurality of historical medical records orscientific research data of a plurality of subjects.

The determination module 420 may determine a target region based on theheight data obtained by the obtaining module 410. The target region maycorrespond to a target portion of the subject to be scanned by animaging device (e.g., the device 110). The determination module 420 maydetermine one or more target datasets from the plurality of datasetsobtained by the obtaining module 410. The height data in the one or moretarget datasets may be closest, among the plurality of datasets, to theheight data of the subject. The determination module 420 may furtherdetermine the target region based on one or more candidate regions inthe one or more target datasets that correspond to the target portion ofthe subject.

The scanning module 430 may determine a plurality of movement parametersassociated with the imaging device based on the target region. In someembodiments, one or more components of the imaging device may becontrolled to move based on the plurality of movement parameters so thatthe scan can be performed on the target region of the subject. The oneor more components of the imaging device may be moved before the scanand/or during the scan. For instance, when the imaging device is anX-ray machine, a mechanical arm connected to an X-ray generation devicemay be controlled to move the X-ray generation device, thereby directingX-rays towards the target region. As another example, when the imagingdevice is a cone beam CT scanner, a couch may be controlled to move, forexample, along a horizontal direction to adjust the position of thesubject respective to a radiation source, and a gantry where theradiation source is located may be controlled to rotate to adjust adirection of the radiation beams. If the one or more components of theimaging device is moved during the scan, the plurality of movementparameters may include a start location and an end location for thescan.

In some embodiments, the scanning module 430 may determine a position ofthe subject in the imaging device and determine the plurality ofmovement parameters based on the target region of the subject and theposition of the subject in the imaging device. In some embodiments, thescanning module 430 may cause one or more components of the imagingdevice to move according to the plurality of movement parameters toobtain a simulated region to be scanned on the subject. The simulatedregion may be an actual region that the imaging device may scan. Thescanning module 430 may determine whether the simulated region matchesthe target portion of the subject. In response to a determination thatthe simulated region does not match the target portion of the subject,the scanning module 430 may correct at least one of the one or moremovement parameters so that the target portion of the subject may bescanned.

It should be noted that the above description is merely provided for thepurposes of illustration, and not intended to limit the scope of thepresent disclosure. For persons having ordinary skills in the art,multiple variations or modifications may be made under the teachings ofthe present disclosure. However, those variations and modifications donot depart from the scope of the present disclosure. In someembodiments, any module mentioned above may be divided into two or moreunits. In some embodiments, the system 400 may include one or moreadditional modules. For example, the system 400 may further include atransmitting module configured to transmit the one or more movementparameters to the device 110. As another example, the system 400 mayfurther include an imaging device (e.g., an X-ray machine).

FIG. 5 is a block diagram illustrating an exemplary system forperforming a target examination on a subject according to someembodiments of the present disclosure. As illustrated in FIG. 5 , thedevice 500 may include an acquisition module 510, a parameter generationmodule 520, and a parameter updating module 530. In some embodiments,the device 500 may be implemented on the processing device 140. Themodules may be hardware circuits of all or part of the processing device140. The modules may also be implemented as an application or set ofinstructions read and executed by the processing device 140. Further,the modules may be any combination of the hardware circuits and theapplication/instructions. For example, the modules may be the part ofthe processing device 140 when the processing device 140 is executingthe application/set of instructions.

The acquisition module 510 may obtain data from one or more componentsof the system 100, such as the storage device 150. Ins some embodiments,the acquisition module 510 may obtain target examination information ofa subject. In some embodiments, the target examination information ofthe subject may include personal information of the subject, forexample, the identification number, the name, the age, the gender, theheight, the weight, or the like. Additionally or alternatively, thetarget examination information of the subject may further include a typeof a target examination to be performed on the subject and/or a targetportion of the subject to be examined such as a lung, a leg, thestomach, etc. In some embodiments, the target examination information ofthe subject may be obtained before the target examination is performedon the subject. In some embodiments, the acquisition module 510 mayobtain one or more historical examination parameters associated with thesubject. In some embodiments, the one or more historical examinationparameters may correspond to the target examination information of thesubject. The processing device 140 may obtain one or more firsthistorical examination records associated with the subject. The one ormore first historical examination records may correspond to differentexamination information of the subject. A doctor or an operator may haveconfirmed that the plurality of historical examination records of thesubject can be used as a reference for the target examination.

The parameter generation module 520 may generate one or more initialexamination parameters based on the target examination information. Forinstance, one or more examination parameters for a CT scan may include atube voltage of a radiation source, a tube current of the radiationsource, an irradiation field of a beam limiter, one or more positionparameters related to the subject in the imaging device, a scanning mode(e.g., a helical scan, a non-helical scan), or the like, or anycombination thereof. In some embodiments, there may be a plurality ofsets of examination parameters corresponding to different targetportions of the subject (e.g., a patient, an animal). The parametergeneration module 520 and/or a user (e.g., an operator) may select a setof examination parameters from the plurality of sets of examinationparameters according to a part of the subject's need to check. Theselected set of examination parameters may be designated as the one ormore initial examination parameters.

The parameter updating module 530 may update at least one of the one ormore initial examination parameters based on the one or more historicalexamination parameters to obtain one or more target examinationparameters. In some embodiments, the one or more historical examinationparameters may be used as a reference for correcting at least one of theone or more initial examination parameters. In some embodiments, the oneor more historical examination parameters may be used to replace atleast one of the one or more initial examination parameters. In someembodiments, the parameter updating module 530 may automatically corrector replace the at least one of the one or more initial examinationparameters based on the one or more historical examination parameters.In some embodiments, the operator may manually correct or replace the atleast one of the one or more initial examination parameters based on theone or more historical examination parameters.

It should be noted that the above description is merely provided for thepurposes of illustration, and not intended to limit the scope of thepresent disclosure. For persons having ordinary skills in the art,multiple variations or modifications may be made under the teachings ofthe present disclosure. However, those variations and modifications donot depart from the scope of the present disclosure. In someembodiments, at least a portion of the functions described for a modulemay be performed by another module. In some embodiments, a moduledescribed in FIG. 5 may be divided into one or more units. For example,the parameter generation module 520 may include a target examinationinformation acquisition unit and a selecting unit. The targetexamination information acquisition unit, rather than the acquisitionmodule 510, may obtain target examination information of the subject.The selecting unit may generate one or more initial examinationparameters.

FIG. 6 is a flowchart illustrating an exemplary process for determininga plurality of movement parameters associated with an imaging deviceaccording to some embodiments of the present disclosure. At least aportion of process 600 may be implemented on the computing device 200 asillustrated in FIG. 2 . In some embodiments, one or more operations ofthe process 600 may be implemented in the system 100 as illustrated inFIG. 1 . The device 110 for performing an examination on a subject maybe an imaging device for performing a scan on the subject. In someembodiments, one or more operations in the process 600 may be stored inthe storage device 150 (e.g., the non-volatile storage medium 230, thememory 260, etc.) as a form of instructions, and invoked and/or executedby the processing device 140, the processor 210 of the computing device200, and/or one or more modules in FIG. 4 . In some embodiments, theinstructions may be transmitted in the form of electronic current orelectrical signals.

In 602, the processing device 140 (e.g., the obtaining module 410) mayobtain height data of a subject. The subject may include a biologicalsubject (e.g., an animal, a human) or a non-biological subject (e.g., aphantom). In some embodiments, the height data of the subject may beobtained from a historical medical record of the subject. As usedherein, a historical medical record, or referred to as a historicalexamination record, of a subject may be a record of an examination ofthe subject performed previously. For example, when the subject is anadult human (e.g., between the age of 25 years old and 50 years old),the height of the subject may tend to remain unchanged as the subjectgrows older. Thus, the processing device 140 may obtain the height dataof the subject from a historical medical record (e.g., a latesthistorical medical record) of the subject stored in the storage device150. Alternatively, when there is no historical medical record thatincludes the height data of the subject in the storage device 150, orwhen the subject is a child or a teenager whose height may increase asthe subject grows older, a measurement of the height of the subject maybe performed before the scan to obtain the height data of the subject.

In 604, the processing device 140 (e.g., the determination module 420)may determine, based on the height data of the subject, a target regioncorresponding to a target portion of the subject for a scan on thesubject by an imaging device. The target portion of the subject mayinclude, for example, the head, the chest, the abdomen, a breast, a leg,or the like, or a portion thereof, or a combination thereof. In someembodiments, the target portion may be identified from a historicalmedical record (e.g., a latest historical medical record) of thesubject. For instance, if the latest historical medical record indicatesthat the subject is suffering from a tumor located in the left lung andthe scan is intended to obtain information related to the tumor, theprocessing device 140 may identify the target portion as the left lung.Alternatively, the target portion may be determined based on a manualinput by a user, such as a doctor or an operator. As used herein, theterm “target region” refers to a region of the subject that includes thetarget portion. The medical imaging device may perform the scan on thetarget region of the subject. For example, the scan may be an X-rayscan, a CT scan, an MR scan, a PET scan, or the like, or a combinationthereof. In some embodiments, the scan may be a pre-scan for obtaining ascout image of the subject. The scout image may be used to locate aregion of interest (ROI) within the target region for a subsequent scan.For instance, the ROI may include a tumor, a broken bone, calcifiedtissue, or the like, or any combination thereof.

For a subject such as a human or an animal, the location of differentportions of the subject may be associated with a height of the subject.Thus, the target region to be scanned by the medical imaging device maycorrelate with the height data of the subject. For instance, theprocessing device 140 may obtain a database including a plurality ofdatasets corresponding to different height data. Each of the pluralityof datasets may include height data and a plurality of candidate regionscorresponding to a plurality of candidate portions associated with theheight data. In some embodiments, the plurality of datasets may bedetermined based on a plurality of historical medical records orscientific research data of a plurality of subjects. In someembodiments, each of the plurality of candidate region corresponding tothe height data and one of the plurality of candidate portions may be anaverage candidate region determined based on the plurality of historicalmedical records or the scientific research data. The processing device140 may determine one or more target datasets from the plurality ofdatasets. The height data in the one or more target datasets may beclosest, among the plurality of datasets, to the height data of thesubject. The processing device 140 may further determine the targetregion based on one or more candidate regions in the one or more targetdatasets that correspond to the target portion of the subject. Moredetails regarding the determination of the target region may be foundelsewhere in the present disclosure, for example, in FIG. 8 and thedescription thereof.

In 606, the processing device 140 (e.g., the scanning module 430) maydetermine a plurality of movement parameters associated with the imagingdevice based on the target region. In some embodiments, one or morecomponents of the imaging device may be controlled to move based on theplurality of movement parameters so that the scan can be performed onthe target region of the subject. The one or more components of theimaging device may be moved before the scan and/or during the scan. Forinstance, when the imaging device is an X-ray machine, a mechanical armconnected to an X-ray generation device may be controlled to move theX-ray generation device, thereby directing X-rays towards the targetregion. As another example, when the imaging device is a cone beam CTscanner, a couch may be controlled to move, for example, along ahorizontal direction to adjust the position of the subject respective toa radiation source, and a gantry where the radiation source is locatedmay be controlled to rotate to adjust a direction of the radiationbeams. If the one or more components of the imaging device is movedduring the scan, the plurality of movement parameters may include astart location and an end location for the scan.

In some embodiments, the processing device 140 may determine a positionof the subject in the imaging device and determine the plurality ofmovement parameters based on the target region of the subject and theposition of the subject in the imaging device. The position of thesubject in the imaging device may be a position of the subject relativeto one or more components of the imaging device. For instance, theposition of the subject in a CT scanner may be the position of thesubject relative to a couch of the CT scanner. For instance, theplurality of movement parameters for the scan on the subject may includea set of movement parameters for each of the one or more components ofthe imaging device that is controlled to move for performing the scan,such as the mechanical arm of the X-ray machine, the couch or the gantryof the cone beam CT scanner, etc. In some embodiments, the processingdevice 140 may transmit the plurality of movement parameters to one ormore components of the system 100, such as the device 110, the terminal130, and/or the storage device 150. In some embodiments, the processingdevice 140 may determine the plurality of movement parameters associatedwith the imaging device for the scan and control the imaging device toperform the scan on the target region of the subject based on theplurality of movement parameters.

In some embodiments, the processing device 140 may compare a size of thetarget region and a size of a maximum scanning range of a single scan bythe imaging device. In response to a result that the size of the targetregion is greater than the maximum scanning scope, the imaging devicemay perform a plurality of sub-scans on the target portion of thesubject to obtain a panoramic image. For instance, when the scan is tobe performed on a large target portion of the subject, such as the spineand/or the lower limbs of the subject, the maximum scanning range of theimaging device (e.g., the X-ray machine) may be smaller than the targetregion. A plurality of sub-regions may be generated based on the targetregion. In some embodiments, the plurality of sub-regions may beoverlapped by each other. The imaging device may perform a plurality ofsub-scans on the plurality of sub-regions to obtain a plurality ofimages. The movement parameters for each of the plurality of sub-scansmay include a start position and an end location corresponding to one ofthe plurality of sub-regions. A plurality of images may be obtained bythe plurality of sub-scans on the plurality of sub-regions.

The method for determining the plurality of movement parameters asdescribed is relatively simple and fast, which may simplify theoperation process of the doctor or the operator, reduce the timeduration of the scan. The method may also avoid using a radiation fieldindicator of a beam limiter to determine the target region, therebyavoiding possible harm to the subject (e.g., a patient) caused by theradiation field indicator.

It should be noted that the above description regarding the process 600is merely provided for the purposes of illustration, and not intended tolimit the scope of the present disclosure. For persons having ordinaryskills in the art, multiple variations or modifications may be madeunder the teachings of the present disclosure. However, those variationsand modifications do not depart from the scope of the presentdisclosure. In some embodiments, one or more operations may be omittedand/or one or more additional operations may be added. For example, theprocess 600 may further include an operation to transmit the pluralityof movement parameters to one or more components of the system 100, suchas the terminal(s) 130 and/or the device 110.

FIG. 7 is a schematic diagram illustrating an exemplary X-ray generationdevice according to some embodiments of the present disclosure. Thedevice 110 may be implemented on the device 700 shown in FIG. 7 . Thedevice 700 may include a support 710, a column 720, a panel detector 730(e.g., a flat panel detector), an X-ray generation device 740, amechanical arm 750, and a processor (e.g., the processing device 140 orthe processor 210 of the computing device 200). The support 710 may bedirected towards the X-ray generation device 740, and the X-raygeneration device 740 may be connected with the mechanical arm 750 thatis disposed on the wall (e.g., the ceiling of an operation room). Thepanel detector 730 may be disposed behind the support 710, and the paneldetector 730 disposed on the column 720 may be capable of moving alongthe column 720. It may be understood that the manner of controlling themovement of the X-ray generation device 740 is not limited to using themechanism arm 750 mounted on the ceiling. Other manners such as usingthe mechanism arm 750 attached to a supporting column that stands on thefloor, or the like, may also be applicable.

When the scan is performed on the target region corresponding to thetarget portion of the subject, the subject may stand on the support 710as shown in FIG. 7 . The processing device 140 may determine the targetregion to be scanned according to the height data obtained from thehistorical medical record or a measurement of the height of the subjectbefore the scan. The processing device 140 may determine the position ofthe X-ray generation device 740, for example, by aligning the X-raygeneration device 740 with a center of the target region. The processingdevice 140 may further determine the movement of the X-ray generationdevice 740, for example, by determining an extent of stretching out ordrawing back the mechanical arm 750 and an angle of the angular rotationof the X-ray generation device 740. The processing device 140 mayfurther determine a distance by which the panel detector 730 (e.g., aflat panel detector) is moved along the column 720 to align with thetarget region. After the X-ray generation device 740 aligns with thetarget region, the doctor or the operator may send an instruction to theX-ray machine to start the scan. The X-rays may be emitted from a bulbin the X-ray generation device 740, and the panel detector 730 mayreceive at least a portion of the emitted X-rays, including thosepassing through the subject. The received signal may be used to generatean X-ray image of the target region.

It should be noted that the above description regarding the FIG. 7 ismerely provided for the purposes of illustration, and not intended tolimit the scope of the present disclosure. For persons having ordinaryskills in the art, multiple variations or modifications may be madeunder the teachings of the present disclosure. However, those variationsand modifications do not depart from the scope of the presentdisclosure. For example, instead of the X-ray machine shown in FIG. 7 ,the imaging device may be a CT scanner, an MR scanner, a PET scanner,etc. As another example, the subject may lie on a couch of the imagingdevice.

FIG. 8 is a flowchart illustrating an exemplary process for determiningthe target region associated with an imaging device according to someembodiments of the present disclosure. In some embodiments, operation604 may be performed according to operations 802-814 in the process 800shown in FIG. 8 . At least a portion of the process 800 may beimplemented on the computing device 200 as illustrated in FIG. 2 . Insome embodiments, one or more operations of the process 800 may beimplemented in the system 100 as illustrated in FIG. 1 . In someembodiments, one or more operations in the process 800 may be stored inthe storage device 150 (e.g., the non-volatile storage medium 230, thememory 260, etc.) as a form of instructions, and invoked and/or executedby the processing device 140, the processor 210 of the computing device200, and/or one or more modules in FIG. 4 . In some embodiments, theinstructions may be transmitted in the form of electronic current orelectrical signals.

In 802, the processing device 140 (e.g., the determination module 420)may determine one or more target datasets from a plurality of datasetsin a database. Candidate height data in the one or more target datasetsmay be closest, among the plurality of datasets, to the height data ofthe subject. In some embodiments, the database may be stored in a localstorage medium, such as a hard disk, or may be stored in a remoteonlinestorage medium. The database may include a plurality of datasets.Each of the plurality of datasets may include candidate height data anda plurality of candidate regions corresponding to a plurality ofcandidate portions associated with the candidate height data. In someembodiments, to ensure a certain accuracy of the determination of thetarget region, the database may include a sufficient number (or count)of datasets. These datasets may be determined based on a plurality ofhistorical medical records or scientific research. In some embodiments,each of the plurality of candidate regions corresponding to the heightdata and one of the plurality of candidate portions may be an averagecandidate region determined based on the plurality of historical medicalrecords.

The processing device 140 may determine one or more target datasets fromthe plurality of datasets. The candidate height data in the one or moretarget datasets may be closest, among the plurality of datasets, to theheight data of the subject. The precision level of the height data maybe a centimeter level or a millimeter level. To determine the one ormore target datasets, the processing device 140 may determine, for eachof the plurality of datasets, an absolute value of a difference betweenthe height data of the dataset and the height data of the subject. Oneor more datasets corresponding to the minimum absolute value of thedifference may be determined as the one or more target dataset. Forexample, if the absolute value of the difference corresponding to adataset is zero, that is, the height data of a dataset is the same asthe height data of the subject, the dataset may be determined as one ofthe one or more target datasets. The processing engine may proceed tooperation 804 or operation 808 based on a number count of the targetdatasets.

In 804, the processing device 140 (e.g., the determination module 420)may determine that candidate height data of only one target dataset,among a plurality of datasets, is closest to the height data of thesubject. Then the processing device 140 may proceed to operation 806.

In 806, the processing device 140 (e.g., the determination module 420)may determine a candidate region of the only one target dataset as thetarget region. Then the processing device 140 may proceed to operation812.

In 808, the processing device 140 (e.g., the determination module 420)may determine that candidate height data of multiple target datasets,among the plurality of datasets, is closest to the height data of thesubject. Then the processing device 140 may proceed to operation 810.

In 810, the processing device 140 (e.g., the determination module 420)may determine, based on multiple candidate regions corresponding to thetarget portion identified from the multiple target datasets, an averageregion as the target region. Then the processing device 140 may proceedto operation 812.

The target region may be a region that includes the target portion onthe body of the subject. For instance, the target region may be arectangle. To determine the target region, the processing device 140 maydetermine a set of coordinates of a center of the target region, a firstboundary of the target region that is relatively close to the head ofthe subject, and a second boundary of the target region that isrelatively close to the feet of the subject. The processing device 140may determine a first distance between the first boundary of the targetregion and the feet of the subject, and determine a second distancebetween the second boundary of the target region and the feet of thesubject.

To determine an average region based on the multiple candidate regions,the processing device 140 may determine a set of coordinates of anaverage center based on multiple sets of coordinates of centers of themultiple candidate regions. The processing device 140 may determine afirst average boundary based on the first boundaries of the multiplecandidate regions and determine a second average boundary based on thesecond boundaries of the multiple candidate regions. The target regionmay be defined by the set of coordinates of the average center, thefirst average boundary, and the second average boundary.

In 812, the processing device 140 (e.g., the determination module 420)may determine whether a difference between the candidate height data inthe one or more target datasets and the height data of the subject isgreater than a threshold.

In some embodiments, the height data of the subject may be significantlydifferent from the height data in the target dataset. For instance, whenthe subject is a dwarf or suffers from gigantism, the target regiondetermined based on the one or more target datasets may be inaccurate.Therefore, the processing device 140 may compare the difference with athreshold. In response to a determination that the difference (i.e., anabsolute value of the difference) is greater than the threshold, theprocessing device 140 may determine that the target region needs to becorrected. In response to a determination that the difference is lessthan or equal to the threshold, the processing device 140 may determinethat the target region does not need to be corrected. The value of thethreshold be a default value set in the system 100. For example, thevalue of the threshold may be set as 3 centimeters (cm), 2 cm, 1 cm, orthe like.

In 814, the processing device 140 (e.g., the determination module 420)may correct the target region.

In some embodiments, the processing device 140 may automatically correctthe target region. The target region may be enlarged or reducedaccording to a predetermined rule. The position of the center, the firstboundary, or the second boundary of the target region to be scanned maybe adjusted, thereby compensating for the difference between the heightdata of the target dataset and the height data of the subject. In someembodiments, a user (e.g., an operator or a doctor) may manually correctthe target region.

In 816, the storage device 150 may store the height data of the subjectand the target region corresponding to the target portion in thedatabase.

In some embodiments, the height data of the subject and the targetregion corresponding to the target portion of the subject may be storedin the dataset to update the database for future use. Thus, an accuracyof determining the target region corresponding to the target portion ofthe same subject or another subject with the same height or a similarheight may be improved.

FIG. 9 is a flowchart illustrating an exemplary process for performing ascan on the subject based on the plurality of movement parametersassociated with the imaging device according to some embodiments of thepresent disclosure. At least a portion of process 900 may be implementedon the computing device 200 as illustrated in FIG. 2 . In someembodiments, one or more operations of the process 900 may beimplemented in the system 100 as illustrated in FIG. 1 . In someembodiments, one or more operations in the process 900 may be stored inthe storage device 150 (e.g., the non-volatile storage medium 230, thememory 260, etc.) as a form of instructions, and invoked and/or executedby the processing device 140, the processor 210 of the computing device200, and/or one or more modules in FIG. 4 . In some embodiments, theinstructions may be transmitted in the form of electronic current orelectrical signals.

In 902, the processing device 140 (e.g., the scanning module 430) maycause one or more components of the imaging device to move according tothe plurality of movement parameters to obtain a simulated region to bescanned on the subject. The simulated region may be an actual regionthat the imaging device may scan. In some embodiments, the plurality ofmovement parameters determined based on the target region may not besuitable for the scan due to, for example, a significant differencebetween the target region determined by the processing device 140 and anactual region that covers the target portion of the subject. In order toensure that the scan is performed on the target portion of the subject,the processing device 140 may perform a simulation process (e.g., theprocess 900). The processing device 140 may cause the one or morecomponents of the imaging device (e.g., the mechanical arm of the X-raymachine, the couch of a CT scanner) to move according to the pluralityof movement parameters to obtain a simulated region to be scanned on thesubject. In some embodiments, during the simulation process, the paneldetector (e.g., a flat panel detector) or the chest cassette of theX-ray machine does not need to be moved.

In some embodiments, in order to make it convenient for the operator togive an instruction to start the process 900, a simulation button may beset on the control interface of the terminal 130 or the imaging device.The operator may press the simulation button to cause the processingdevice 140 to perform the process 900. Then one or more components ofthe imaging device may be controlled to move based on the plurality ofmovement parameters.

In 904, the processing device 140 (e.g., the scanning module 430) maydetermine whether the simulated region matches the target portion of thesubject. The simulated region may be identified by the processing device140 and/or an operator. For example, the simulated region may beidentified using a laser indicator. As another example, the simulationregion may be identified using a beam limiter. The processing device 140and/or the operator may determine whether the simulated region matchesthe target portion of the subject. In response to a determination thatthe simulated region matches the target portion of the subject, theprocessing device 140 may proceed to operation 908.

In 906, the processing device 140 (e.g., the scanning module 430) maycorrect at least one of the plurality of movement parameters. In someembodiments, the processing device 140 and/or the operator may correct astart position and/or an end position associated with the imaging devicefor the scan. For example, if the simulated region does not cover a partof the target portion of the subject, the processing device 140 maycorrect the start position and/or the end position so that the simulatedregion can be enlarged to cover all of the target portion of thesubject. In some embodiments, if a plurality of sub-scans are needed tocomplete the scan on the target region (as described, for example, inoperation 606), the processing device 140 may correct a plurality ofstart positions and a plurality of end positions corresponding to theplurality of sub-scans.

In 908, the processing device 140 (e.g., the scanning module 430) maycause the imaging device to perform the scan on the subject. In someembodiments, one or more components of the imaging device (e.g., anX-ray machine) may remain still during the scan. In some embodiments,one or more components of the imaging device (e.g., a cone beam CTscanner) may be controlled to move according to the plurality ofmovement parameters during the scan. An image reconstruction algorithmmay be used to reconstruct an image of the target portion of the subjectbased on scan data obtained from the scan.

It should be noted that the above description regarding the process 900is merely provided for the purposes of illustration, and not intended tolimit the scope of the present disclosure. For persons having ordinaryskills in the art, multiple variations or modifications may be madeunder the teachings of the present disclosure. However, those variationsand modifications do not depart from the scope of the presentdisclosure.

FIG. 10 is a flowchart illustrating an exemplary process for determiningone or more target examinations for a target examination on a subjectaccording to some embodiments of the present disclosure. At least aportion of process 1000 may be implemented on the computing device 200as illustrated in FIG. 2 . In some embodiments, one or more operationsof the process 1000 may be implemented in the system 100 as illustratedin FIG. 1 . In some embodiments, one or more operations in the process1000 may be stored in the storage device 150 (e.g., the non-volatilestorage medium 230, the memory 260, etc.) as a form of instructions, andinvoked and/or executed by the processing device 140, the processor 210of the computing device 200, or one or more modules in FIG. 5 . In someembodiments, the instructions may be transmitted in the form ofelectronic current or electrical signals.

In 1002, the processing device 140 (e.g., the acquisition module 510)may obtain target examination information of a subject. In someembodiments, the target examination information of the subject mayinclude personal information of the subject, for example, theidentification number, the name, the age, the gender, the height, theweight, or the like. Additionally or alternatively, the targetexamination information of the subject may further include a type of atarget examination to be performed on the subject and/or a targetportion of the subject to be examined such as a lung, a leg, thestomach, etc. In some embodiments, the target examination information ofthe subject may be obtained before the target examination is performedon the subject. For instance, the subject may fill out an examinationform to provide the target examination information to the system 100. Asanother example, an operator may input the target examinationinformation via the terminal 130 for the subject. As yet anotherexample, at least a portion of the target examination information may beobtained from a historical examination record of the subject, such asthe gender, the age. In some embodiments, the target examination may bea medical examination intended to obtain health information of thesubject. Merely by way of example, the target examination may be a scanon the subject using a medical imaging device.

In 1004, the processing device 140 (e.g., the parameter generationmodule 520) may generate one or more initial examination parametersbased on the target examination information. As used herein, the term“examination parameter” refers to a technical parameter related to anexamination protocol for the target examination. For instance, one ormore examination parameters for a CT scan may include a tube voltage ofa radiation source, a tube current of the radiation source, anirradiation field of a beam limiter, one or more position parametersrelated to the subject in the imaging device, a scanning mode (e.g., ahelical scan, a non-helical scan), or the like, or any combinationthereof. In some embodiments, there may be a plurality of sets ofexamination parameters corresponding to different target portions of thesubject (e.g., a patient, an animal). The processing device 140 and/or auser (e.g., an operator) may select a set of examination parameters fromthe plurality of sets of examination parameters according to a part ofthe subject's need to check. The selected set of examination parametersmay be designated as the one or more initial examination parameters. Insome embodiments, the initial examination parameter may be unsuitablefor the subject. For example, when a scan is performed on the subject,if the subject is relatively fat, a dose (i.e., an initial examinationparameter) may be insufficient due to the thickness of the targetportion of the subject. The operator may need to manually adjust aportion of the initial parameters and determine whether the adjustedexamination parameters can be used in the target examination on thesubject, which may complicate the work associated with the targetexamination. In order to simplify the work of the operator and improvean accuracy of target examination parameters used in the targetexamination, the processing device 140 may proceed to operation 1006.

In 1006, the processing device 140 (e.g., the acquisition module 510)may obtain one or more historical examination parameters associated withthe subject. In some embodiments, the one or more historical examinationparameters may correspond to the target examination information of thesubject. The processing device 140 may obtain one or more firsthistorical examination records associated with the subject. The one ormore first historical examination records may correspond to differentexamination information of the subject. A doctor or an operator may haveconfirmed that the plurality of historical examination records of thesubject can be used as a reference for the target examination. Theprocessing device 140 may further determine whether the one or morefirst historical examination records include one or more secondhistorical examination records matching the target examinationinformation. In some embodiments, the processing device 140 maydetermine a matching degree between the target examination andhistorical examination information in the one or more first historicalexamination records. The processing device 140 may further compare theone or more matching degrees corresponding to the one or more firsthistorical examination records with a matching degree threshold. Theprocessing device 140 may designate the one or more first historicalexamination records of which the one or more matching degrees aregreater than the matching degree threshold as the one or more secondhistorical examination records.

In response to a determination that none of the one or more firsthistorical examination records match the target examination information,the processing device 140 may designate the one or more initialexamination parameters as the one or more target examination parameters.Alternatively, the operator may manually correct the one or more initialexamination parameters to obtain the one or more target examinationparameters. In response to a determination that only one secondhistorical examination record matches the target examinationinformation, the processing device 140 may obtain the one or morehistorical examination parameters from the only one second historicalexamination record. In response to a determination that multiple secondhistorical examination records match the target examination information,the processing device 140 may assess, for each of the multiple secondhistorical examination records, a degree of similarity betweenexamination information of an examination corresponding to the secondhistorical examination record and the target examination information.The processing device 140 may identify, from the multiple secondhistorical examination records, a third historical examination record ofan examination that has, among the one or more second historicalexamination records, a highest degree of similarity with the targetexamination information. The processing device 140 may obtain the one ormore historical examination parameters from the third historicalexamination record. More details regarding obtaining the one or morehistorical examination parameters from the third historical examinationrecord may be found elsewhere in the present disclosure, for example, inFIG. 11 and the description thereof.

In 1008, the processing device 140 (e.g., the parameter updating module530) may update at least one of the one or more initial examinationparameters based on the one or more historical examination parameters toobtain one or more target examination parameters. In some embodiments,the one or more historical examination parameters may be used as areference for correcting at least one of the one or more initialexamination parameters. In some embodiments, the one or more historicalexamination parameters may be used to replace at least one of the one ormore initial examination parameters. In some embodiments, the processingdevice 140 may automatically correct or replace the at least one of theone or more initial examination parameters based on the one or morehistorical examination parameters. In some embodiments, the operator maymanually correct or replace the at least one of the one or more initialexamination parameters based on the one or more historical examinationparameters. In some embodiments, the storage device 150 may store theone or more target examination parameters and the target examinationinformation of the subject for future use.

A device (e.g., the device 110) may be used to perform the targetexamination on the subject. In some embodiments, the target examinationmay be a scan on the subject and the device 110 may be an imagingdevice. The target examination information of the subject may includeheight data and a target portion of the subject to be scanned by theimaging device. The one or more target examination parameters mayinclude a target region corresponding to the target portion of thesubject. The target portion of the subject may be within the targetregion. The processing device 140 may further determine, based on thetarget region, a plurality of movement parameters associated with theimaging device. The plurality of movement parameters may include atleast one start position and at least one end position for the scan. Insome embodiments, the processing device 140 may determine the pluralityof movement parameters based on the target region of the subject and aposition of the subject in the imaging device. More details regardingthe determination of the plurality of movement parameters may be foundelsewhere in the present disclosure, for example, in operation 606 ofthe process 600.

It should be noted that the above description regarding the process 1000is merely provided for the purposes of illustration, and not intended tolimit the scope of the present disclosure. For persons having ordinaryskills in the art, multiple variations or modifications may be madeunder the teachings of the present disclosure. However, those variationsand modifications do not depart from the scope of the presentdisclosure.

FIG. 11 is a flowchart illustrating an exemplary process for determiningthe one or more target examination parameters for the target examinationon the subject based on multiple second historical examination recordsthat match target examination of the subject according to someembodiments of the present disclosure. At least a portion of process1100 may be implemented on the computing device 200 as illustrated inFIG. 2 . In some embodiments, one or more operations of the process 1100may be implemented in the system 100 as illustrated in FIG. 1 . In someembodiments, one or more operations in the process 1100 may be stored inthe storage device 150 (e.g., the non-volatile storage medium 230, thememory 260, etc.) as a form of instructions, and invoked and/or executedby the processing device 140, the processor 210 of the computing device200, or one or more modules in FIG. 5 . In some embodiments, theinstructions may be transmitted in the form of electronic current orelectrical signals.

In 1102, the processing device 140 (e.g., the acquisition module 510)may obtain multiple first historical examination records associated withthe subject. The one or more first historical examination records maymatch with the target examination information of the subject. Themultiple first historical examination records may be stored in thestorage device 150 in any form, such as a text description, a table, agraph, or the like, or any combination thereof. The processing device140 may obtain the multiple first historical examination records fromthe storage device 150.

In 1104, the processing device 140 (e.g., the parameter updating module530) may determine multiple second historical examination records that,among the one or more first historical examination records, match thetarget examination information. The target examination information mayinclude one or more features, such as the age, the gender, the height ofthe subject, the target portion to be examined, or the like, or anycombination thereof.

In 1106, the processing device 140 (e.g., the parameter updating module530) may assess, for each of the multiple second historical examinationrecords, a degree of similarity between examination information of anexamination corresponding to the second historical examination recordand the target examination information.

In 1108, the processing device 140 (e.g., the parameter updating module530) may identify, from the multiple second historical examinationrecords, a third historical examination record of an examination thathas, among the multiple second historical examination records, a highestdegree of similarity with the target examination information.

In some embodiments, in operation 1106, the processing device 140 mayassess the degree of the similarity by comparing, for each of themultiple second historical examination records, a time when anexamination corresponding to the second historical examination occurredand a time of the target examination. The time of the target examinationmay be a time when the target examination is to be performed. In someembodiments, a current time for performing the operation 1106 may beused to represent the time of the target examination. It may beunderstood that a status (e.g., physical conditions) of the subject inan examination that occurred at the time closest to the time of thetarget examination may be close to a status of the subject in the targetexamination. In operation 1108, the processing device 140 may identify asecond historical examination record of an examination that, among themultiple second historical examination records, occurred at a timeclosest to the time of the target examination as the third historicalexamination record.

In some embodiments, in operation 1106, the processing device 140 mayaccess the similarity by comparing, for each of the multiple secondhistorical examination records, a parameter of interest of a device(e.g., a device model) used in an examination corresponding to thesecond historical examination record and a corresponding parameter of adevice to be used in the target examination. The processing device 140may determine the third historical examination record based on a resultof the comparison. In some embodiments, the processing device 140 maydetermine a result that for each examination corresponding to one of themultiple second historical examination records, the parameter ofinterest of a device used therein is different from the correspondingparameter of the device to be used in the target examination. Inresponse to such a result, the processing device 140 may compare a timewhen each of multiple examinations corresponding to the multiple secondhistorical examination records occurred and a time of the targetexamination. In operation 1108, the processing device 140 may designatea second historical examination record of an examination that, among themultiple second historical examination records, occurred at a timeclosest to the time of the target examination as the third historicalexamination record.

In some embodiments, in operation 1106, the processing device 140 maydetermine a result that the parameter of interest of the device used inonly one examination corresponding to one of the multiple secondhistorical examination records is the same as the correspondingparameter of the device to be used in the target examination. Inresponse to such a result, in operation 1108, the processing device 140may designate a second historical examination record corresponding tothe only one examination using the device whose parameter of interest isthe same as the corresponding parameter of the device to be used in thetarget examination as the third historical examination record.

In some embodiments, in operation 1106, the processing device 140 maydetermine a result that for each of more than one examination thatcorresponds to more than one second historical examination record of themultiple second historical examination records, the parameter ofinterest of a device used therein is the same as the correspondingparameter of the device to be used in the target examination. As usedherein, an examination that, among one or more examinationscorresponding to the multiple second historical examination records thatmatch the target examination, uses a device having a same parameter ofinterest as the target examination may be referred to as a “firstexamination.” In response to such a result, the processing device 140may compare a time when each of the more than one first examinationoccurred and a time of the target examination. In 1108, the processingdevice 140 may designate a second historical examination record of anexamination that, among the more than one second historical examinationrecord corresponding to the more than one first examination, occurred ata time closest to the time of the target examination as the thirdhistorical examination record.

In some embodiments, in operation 1106, in response to the result thatfor each of the more than one first examination, the parameter ofinterest of the device used therein is the same as the correspondingparameter of the device to be used in the target examination, theprocessing device 140 may compare, in operation 1108, for each of themore than one first examination, at least one position parameterassociated with the subject used in the first examination and at leastone position parameter associated with the subject to be used in thetarget examination. The processing device 140 may further determinewhether for only one first examination among the more than one firstexamination, the at least one position parameter associated with thesubject used therein is the same as the at least one position parameterassociated with the subject to be used in the target examination. Inresponse to a determination that for only one first examination amongthe more than one first examination, at least one position parameterassociated with the subject used therein is the same as the at least oneposition parameter associated with the subject to be used in the targetexamination, the processing device 140 may designate a second historicalexamination record corresponding to the only one first examination asthe third historical examination record.

In some embodiments, in operation 1108, the processing device 140 maydetermine whether for each of multiple first examinations among the morethan one first examination, at least one position parameter associatedwith the subject used therein is the same as the at least one positionparameter associated with the subject to be used in the targetexamination. In response to a result that for each of multiple firstexaminations among the more than one first examination, at least oneposition parameter associated with the subject used therein is the sameas the at least one position parameter associated with the subject to beused in the target examination, the processing device 140 may furthercompare a time when each of the multiple first examinations occurred anda time of the target examination. The processing device 140 maydesignate a second historical examination record of an examination that,among the more than one second historical examination recordcorresponding to the more than one examination each using a device whoseparameter of interest is the same as the corresponding parameter of thedevice to be used in the target examination, occurred at a time closestto the time of the target examination as the third historicalexamination record.

In some embodiments, in operation 1108, the processing device 140 maydetermine whether for each of the more than one first examination, theat least one position parameter associated with the subject used thereinis different from the at least one position parameter associated withthe subject to be used in the target examination. In response to adetermination that for each of the more than one first examination, theat least one position parameter associated with the subject used thereinis different from the at least one position parameter associated withthe subject to be used in the target examination, the processing device140 may compare the time when each of the more than one firstexaminations occurred and a time of the target examination. Theprocessing device 140 may designate a second historical examinationrecord of an examination that, among the more than one first examinationeach using a device whose parameter of interest is the same as thecorresponding parameter of the device to be used in the targetexamination, occurred at a time closest to the time of the targetexamination as the third historical examination record.

In 1110, the processing device 140 (e.g., the parameter updating module530 or the acquisition module 510) may obtain the one or more historicalexamination parameters from the third historical examination record. Theone or more historical examination parameters may be used as a referencefor determining the one or more target historical parameters. Theprocessing device 140 and/or the user may obtain the one or more targethistorical parameters by updating at least one of the one or moreinitial historical examination parameters based on the historicalexamination parameters.

It should be noted that the above description regarding the process 1100is merely provided for the purposes of illustration, and not intended tolimit the scope of the present disclosure. For persons having ordinaryskills in the art, multiple variations or modifications may be madeunder the teachings of the present disclosure. However, those variationsand modifications do not depart from the scope of the presentdisclosure.

Having thus described the basic concepts, it may be rather apparent tothose skilled in the art after reading this detailed disclosure that theforegoing detailed disclosure is intended to be presented by way ofexample only and is not limiting. Various alterations, improvements, andmodifications may occur and are intended to those skilled in the art,though not expressly stated herein. These alterations, improvements, andmodifications are intended to be suggested by this disclosure, and arewithin the spirit and scope of the exemplary embodiments of thisdisclosure.

Moreover, certain terminology has been used to describe embodiments ofthe present disclosure. For example, the terms “one embodiment,” “anembodiment,” and “some embodiments” mean that a particular feature,structure or characteristic described in connection with the embodimentis included in at least one embodiment of the present disclosure.Therefore, it is emphasized and should be appreciated that two or morereferences to “an embodiment” or “one embodiment” or “an alternativeembodiment” in various portions of this specification are notnecessarily all referring to the same embodiment. Furthermore, theparticular features, structures or characteristics may be combined assuitable in one or more embodiments of the present disclosure.

Further, it will be appreciated by one skilled in the art, aspects ofthe present disclosure may be illustrated and described herein in any ofa number of patentable classes or context including any new and usefulprocess, machine, manufacture, or composition of matter, or any new anduseful improvement thereof. Accordingly, aspects of the presentdisclosure may be implemented entirely hardware, entirely software(including firmware, resident software, micro-code, etc.) or combiningsoftware and hardware implementation that may all generally be referredto herein as a “module,” “unit,” “component,” “device,” or “system.”Furthermore, aspects of the present disclosure may take the form of acomputer program product embodied in one or more computer readable mediahaving computer readable program code embodied thereon.

A computer readable signal medium may include a propagated data signalwith computer readable program code embodied therein, for example, inbaseband or as part of a carrier wave. Such a propagated signal may takeany of a variety of forms, including electro-magnetic, optical, or thelike, or any suitable combination thereof. A computer readable signalmedium may be any computer readable medium that is not a computerreadable storage medium and that may communicate, propagate, ortransport a program for use by or in connection with an instructionexecution system, apparatus, or device. Program code embodied on acomputer readable signal medium may be transmitted using any appropriatemedium, including wireless, wireline, optical fiber cable, RF, or thelike, or any suitable combination of the foregoing.

Computer program code for carrying out operations for aspects of thepresent disclosure may be written in any combination of one or moreprogramming languages, including an object oriented programming languagesuch as Java, Scala, Smalltalk, Eiffel, JADE, Emerald, C++, C#, VB. NET,Python or the like, conventional procedural programming languages, suchas the “C” programming language, Visual Basic, Fortran 2003, Perl, COBOL2002, PHP, ABAP, dynamic programming languages such as Python, Ruby andGroovy, or other programming languages. The program code may executeentirely on the user's computer, partly on the user's computer, as astand-alone software package, partly on the user's computer and partlyon a remote computer or entirely on the remote computer or server. Inthe latter scenario, the remote computer may be connected to the user'scomputer through any type of network, including a local area network(LAN) or a wide area network (WAN), or the connection may be made to anexternal computer (for example, through the Internet using an InternetService Provider) or in a cloud computing environment or offered as aservice such as a Software as a Service (SaaS).

Furthermore, the recited order of processing elements or sequences, orthe use of numbers, letters, or other designations therefore, is notintended to limit the claimed processes and methods to any order exceptas may be specified in the claims. Although the above disclosurediscusses through various examples what is currently considered to be avariety of useful embodiments of the disclosure, it is to be understoodthat such detail is solely for that purpose, and that the appendedclaims are not limited to the disclosed embodiments, but, on thecontrary, are intended to cover modifications and equivalentarrangements that are within the spirit and scope of the disclosedembodiments. For example, although the implementation of variouscomponents described above may be embodied in a hardware device, it mayalso be implemented as a software only solution, e.g., an installationon an existing server or mobile device.

Similarly, it should be appreciated that in the foregoing description ofembodiments of the present disclosure, various features are sometimesgrouped together in a single embodiment, figure, or description thereoffor the purpose of streamlining the disclosure aiding in theunderstanding of one or more of the various embodiments. This method ofdisclosure, however, is not to be interpreted as reflecting an intentionthat the claimed subject matter requires more features than areexpressly recited in each claim. Rather, claim subject matter lie inless than all features of a single foregoing disclosed embodiment.

1-20. (canceled)
 21. A method for determining one or more targetexamination parameters, implemented on a computing device having atleast one processor and at least one non-transitory storage medium, themethod comprising: obtaining target examination information of asubject; generating one or more initial examination parameters based onthe target examination information; obtaining one or more firsthistorical examination records associated with the subject; determiningwhether the one or more first historical examination records include oneor more second historical examination records matching the targetexamination information; in response to a determination that the one ormore first historical examination records include one or more secondhistorical examination records matching the target examinationinformation, obtaining one or more historical examination parametersfrom the one or more second historical examination records; and updatingat least one of the one or more initial examination parameters based onthe one or more historical examination parameters to obtain one or moretarget examination parameters, wherein the one or more targetexamination parameters are used for performing a target examination onthe subject. 22-38. (canceled)
 39. A system for determining one or moretarget examination parameters, comprising: at least one non-transitorystorage medium including a set of instructions; and at least oneprocessor in communication with the at least one non-transitory storagemedium, wherein when executing the set of instructions, the at least oneprocessor is directed to cause the system to: obtain target examinationinformation of a subject; generate one or more initial examinationparameters based on the target examination information; obtain one ormore first historical examination records associated with the subject;determine whether the one or more first historical examination recordsinclude one or more second historical examination records matching thetarget examination information; in response to a determination that theone or more first historical examination records include one or moresecond historical examination records matching the target examinationinformation, obtain one or more historical examination parameters fromthe one or more second historical examination records; and update atleast one of the one or more initial examination parameters based on theone or more historical examination parameters to obtain one or moretarget examination parameters, wherein the one or more targetexamination parameters are used for performing a target examination onthe subject.
 40. (canceled)
 41. The system of claim 39, wherein toobtain the one or more historical examination parameters from the one ormore second historical examination records, the at least one processoris directed to cause the system to: determine whether only one secondhistorical examination record matches the target examinationinformation; and in response to a determination that only one secondhistorical examination record matches the target examinationinformation, obtain the one or more historical examination parametersfrom the only one second historical examination record.
 42. The systemof claim 39, wherein to obtain the one or more historical examinationparameters from the one or more second historical examination records,the at least one processor is directed to cause the system to: assess,for each of the one or more second historical examination records, adegree of similarity between examination information of an examinationcorresponding to the second historical examination record and the targetexamination information; identify, from the one or more secondhistorical examination records, a third historical examination record ofan examination that has, among the one or more second historicalexamination records, a highest degree of similarity with the targetexamination information; and obtain the one or more historicalexamination parameters from the third historical examination record. 43.The system of claim 42, wherein to assess, for each of the one or moresecond historical examination records, the degree of similarity betweenexamination information of an examination corresponding to the secondhistorical examination record and the target examination information,the at least one processor is directed to cause the system to compare,for each of the one or more second historical examination records, atime when an examination corresponding to the second historicalexamination record occurred and a time of the target examination; and toidentify the third historical examination record of the examination thathas, among the one or more second historical examination records, thehighest degree of similarity with the target examination information,the at least one processor is directed to cause the system to designatea second historical examination record of an examination that, among theone or more second historical examination records, occurred at a timeclosest to the time of the target examination as the third historicalexamination record.
 44. The system of claim 42, wherein to assess, foreach of the one or more second historical examination records, thedegree of similarity between examination information of an examinationcorresponding to the second historical examination record and the targetexamination information, the at least one processor is directed to causethe system to compare, for each of the one or more second historicalexamination records, a parameter of interest of a device used in anexamination corresponding to the second historical examination recordand a corresponding parameter of a device to be used in the targetexamination.
 45. The system of claim 44, wherein to compare, for each ofthe one or more second historical examination records, a parameter ofinterest of a device used in an examination corresponding to the secondhistorical examination record and a corresponding parameter of a deviceto be used in the target examination, the at least one processor isdirected to cause the system to determine whether for each examinationthat corresponds to one of the one or more second historical examinationrecords, the parameter of interest of a device used therein is differentfrom the corresponding parameter of the device to be used in the targetexamination; and in response to a determination that for eachexamination that corresponds to one of the one or more second historicalexamination records, the parameter of interest of the device usedtherein is different from the corresponding parameter of the device tobe used in the target examination, compare a time when each of one ormore examinations corresponding to the one or more second historicalexamination records occurred and a time of the target examination; andto identify the third historical examination record of the examinationthat has, among the one or more second historical examination records,the highest degree of similarity with the target examinationinformation, the at least one processor is directed to cause the systemto designate a second historical examination record of an examinationthat, among the one or more second historical examination records,occurred at a time closest to the time of the target examination as thethird historical examination record.
 46. The system of claim 44, whereinto compare the parameter of interest of the device used in theexamination corresponding to each of the one or more second historicalexamination records and the corresponding parameter of a device to beused in the target examination, the at least one processor is directedto cause the system to determine whether the parameter of interest of adevice used in only one examination corresponding to one of the one ormore second historical examination records is the same as thecorresponding parameter of the device to be used in the targetexamination, and to identify the third historical examination record ofthe examination that has, among the one or more second historicalexamination records, the highest degree of similarity with the targetexamination information, the at least one processor is directed to causethe system to designate a second historical examination recordcorresponding to the only examination using the device whose parameterof interest is the same as the corresponding parameter of the device tobe used in the target examination as the third historical examinationrecord.
 47. The system of claim 44, wherein to compare the parameter ofinterest of the device used in the examination corresponding to each ofthe one or more second historical examination records and thecorresponding parameter of the device to be used in the targetexamination, the at least one processor is directed to cause the systemto determine whether for each of more than one examination thatcorresponds to more than one second historical examination record of theone or more second historical examination records, the parameter ofinterest of a device used therein is the same as the correspondingparameter of the device to be used in the target examination, and inresponse to a determination that for each of more than one examinationthat corresponds to more than one second historical examination of theone or more second historical examination records, the parameter ofinterest of the device used therein is the same as the correspondingparameter of the device to be used in the target examination, compare atime when each of the more than one examination occurred and a time ofthe target examination; and to identify the third historical examinationrecord of the examination that has, among the one or more secondhistorical examination records, the highest degree of similarity withthe target examination information, the at least one processor isdirected to cause the system to: designate a second historicalexamination record of an examination that, among the more than onesecond historical examination record corresponding to the more than oneexamination each using the device whose parameter of interest is thesame as the corresponding parameter of the device to be used in thetarget examination, occurred at a time closest to the time of the targetexamination as the third historical examination record.
 48. The systemof claim 44, wherein to compare, for each of the one or more secondhistorical examination records, the parameter of interest of a deviceused in an examination corresponding to the second historicalexamination record and the corresponding parameter of a device to beused in the target examination, the at least one processor is directedto cause the system to determine whether, for each of more than oneexamination that corresponds to more than one second historicalexamination record of the one or more second historical examinationrecords, the parameter of interest of a device used therein is the sameas the corresponding parameter of the device to be used in the targetexamination, and in response to a determination that for each of morethan one examination that corresponds to more than one second historicalexamination record of the one or more second historical examinationrecords, the parameter of interest of the device used therein is thesame as the corresponding parameter of the device to be used in thetarget examination, compare, for each of the more than one examination,at least one position parameter associated with the examination and atleast one position parameter associated with the subject to be used inthe target examination; and to identify the third historical examinationrecord of an examination that has, among the one or more secondhistorical examination records, the highest degree of similarity withthe target examination information, the at least one processor isdirected to cause the system to determine whether for only oneexamination among the more than one examination each using the devicewhose parameter of interest is the same as the corresponding parameterof the device to be used in the target examination, at least oneposition parameter associated with the subject used therein is the sameas the at least one position parameter associated with the subject to beused in the target examination, and in response to a determination thatfor only one examination among the more than one examination each usingthe device whose parameter of interest is the same as the correspondingparameter of the device to be used in the target examination, at leastone position parameter associated with the subject used therein is thesame as the at least one position parameter associated with the subjectto be used in the target examination, designate a second historicalexamination record corresponding to the only one examination as thethird historical examination record.
 49. The system of claim 44,wherein: to compare, for each of the one or more second historicalexamination records, the parameter of interest of a device used in anexamination corresponding to the second historical examination recordand the corresponding parameter of a device to be used in the targetexamination, the at least one processor is directed to cause the systemto determine whether for each of more than one examination thatcorresponds to more than one second historical examination of the one ormore second historical examination records, the parameter of interest ofa device used therein is the same as the corresponding parameter of thedevice to be used in the target examination, and in response to adetermination that for each of more than one examination thatcorresponds to more than one second historical examination of the one ormore second historical examination records, the parameter of interest ofthe device used therein is the same as the corresponding parameter ofthe device to be used in the target examination, compare at least oneposition parameter associated with the subject in the more than oneexamination and at least one position parameter associated with thesubject in the target examination; and to identify the third historicalexamination record of an examination that has, among the one or moresecond historical examination records, the highest degree of similaritywith the target examination information, the at least one processor isdirected to cause the system to determine whether for each of multipleexaminations among the more than one examination each using a devicewhose parameter of interest is the same as the corresponding parameterof the device to be used in the target examination, at least oneposition parameter associated with the subject used therein is the sameas the at least one position parameter associated with the subject to beused in the target examination, and in response to a determination thatfor each of multiple examinations among the more than one examinationeach using the device whose parameter of interest is the same as thecorresponding parameter of the device to be used in the targetexamination, at least one position parameter associated with the subjectused therein is the same as the at least one position parameterassociated with the subject to be used in the target examination,compare a time when each of the multiple examinations occurred and atime of the target examination, and designate a second historicalexamination record of an examination that, among the multipleexaminations each using the device whose parameter of interest is thesame as the corresponding parameter of the device to be used in thetarget examination and having at least one position parameter associatedwith the subject that is the same as the at least one position parameterassociated with the subject to be used in the target examination,occurred at a time closest to the time of the target examination as thethird historical examination record.
 50. The system of claim 44,wherein: to compare, for each of the one or more second historicalexamination records, the parameter of interest of a device used in anexamination corresponding to the second historical examination recordand a corresponding parameter of a device to be used in the targetexamination, the at least one processor is directed to cause the systemto determine whether for each of more than one examination thatcorresponds to more than one of the one or more second historicalexamination records, the parameter of interest of a device used thereinis the same as the corresponding parameter of the device to be used inthe target examination, and in response to a determination that for eachof more than one examination that corresponds to more than one of theone or more second historical examination records, the parameter ofinterest of the device used therein is the same as the correspondingparameter of the device to be used in the target examination, compare atleast one position parameter associated with the subject in the morethan one examination and at least one position parameter associated withthe subject in the target examination; and to identify the thirdhistorical examination record of the examination that has, among the oneor more second historical examination records, the highest degree ofsimilarity with the target examination information, the at least oneprocessor is directed to cause the system to determine whether for eachexamination of the more than one examination each using the device whoseparameter of interest is the same as the corresponding parameter of thedevice to be used in the target examination, at least one positionparameter associated with the subject used therein is different from theat least one position parameter associated with the subject to be usedin the target examination, and in response to a determination that foreach examination of the more than one examination each using the devicewhose parameter of interest is the same as the corresponding parameterof the device to be used in the target examination, at least oneposition parameter associated with the subject used therein is differentfrom the at least one position parameter associated with the subject tobe used in the target examination, compare a time when each of themultiple examinations occurred and a time of the target examination, anddesignate a second historical examination record of an examination that,among the more than one second historical examination recordcorresponding to the more than one examination each using a device whoseparameter of interest is the same as the corresponding parameter of thedevice to be used in the target examination, occurred at a time closestto the time of the target examination as the third historicalexamination record.
 51. The system of claim 44, wherein the parameter ofinterest of the device includes a device model.
 52. The system of claim39, wherein the at least one processor is further directed to cause thesystem to: store the one or more examination parameters of the targetexamination of the subject.
 53. (canceled)
 54. The system of claim 39,wherein the target examination is a scan on the subject by an imagingdevice; the target examination information of the subject includesheight data and a target portion of the subject to be scanned by theimaging device; and the one or more target examination parametersinclude a target region corresponding to the target portion of thesubject, wherein the target portion is within the target region.
 55. Thesystem of claim 54, wherein the at least one processor is furtherdirected to cause the system to: determine, based on the target region,a plurality of movement parameters associated with the imaging device,wherein the plurality of movement parameters include at least one startposition and at least one end position associated with one or morecomponents of the imaging device.
 56. The system of claim 55, wherein todetermine, based on the target region, the plurality of movementparameters associated with the imaging device, the at least oneprocessor is directed to cause the system to: determine a position ofthe subject in the imaging device; and determine the plurality ofmovement parameters based on the target region and the position of thesubject in the imaging device.
 57. (canceled)
 58. A non-transitorycomputer readable medium, comprising at least one set of instructionsfor determining one or more target examination parameters, wherein whenexecuted by at least one processor of a computing device, the at leastone set of instructions direct the at least one processor to: obtaintarget examination information of a subject; generate one or moreinitial examination parameters based on the target examinationinformation; obtain one or more first historical examination recordsassociated with the subject; determine whether the one or more firsthistorical examination records include one or more second historicalexamination records matching the target examination information; inresponse to a determination that the one or more first historicalexamination records include one or more second historical examinationrecords matching the target examination information, obtain one or morehistorical examination parameters from the one or more second historicalexamination records; and update at least one of the one or more initialexamination parameters based on the one or more historical examinationparameters to obtain one or more target examination parameters, whereinthe one or more target examination parameters are used for performing atarget examination on the subject.
 59. The system of claim 55, whereinthe at least one processor is further directed to cause the system to:cause one or more components of the imaging device to move according tothe plurality of movement parameters to obtain a simulated region to bescanned on the subject; determine whether the simulated region matchesthe target portion of the subject; and in response to a determinationthat the simulated region does not match the target portion of thesubject, correct at least one of the plurality of movement parameters.